Goals of the Bayesian Metrology Project
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Overall Goal
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Research, develop, and apply Bayesian methods to the
metrological problems of NIST; promulgate results to other
metrology laboratories and to NIST customers.
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Four Specific Areas
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Four specific areas are targeted:
- traceability,
- interlaboratory comparisons,
- calibration, and
- part inspection.
These areas were chosen because of their importance to NIST
and their potential benefit from Bayesian methods.
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Date created: 8/28/2001
Last updated: 8/28/2001
Please email comments on this WWW page to
sedwww@nist.gov.
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