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Impetus of the Bayesian Metrology Project |
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| Impetus/How Project Began |
During the past decade with increased computing power and new
research developments, Bayesian statistical methods have become
practical in diverse areas of statistical applications.
Bayesian methods provide a unified framework for optimally combining
information from multiple sources, resulting in simpler and improved
statistical analyses. Despite the widespread growth in Bayesian
methods, for the most part the field of metrology has not taken
advantage of these methods. Both NIST researchers and their
customers have much to gain from these methods.
Recognizing the potential, NIST statisticians began exploring the use of Bayesian methods in several metrological applications. After some initial research, a five year competence initiative on Bayesian metrology was started in FY99. |
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Date created: 8/28/2001 |
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