Bayesian Metrology Seminar Series
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Bayesian Metrology Seminar Series
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SED has conducted a series of internal seminars on various
topics related to Bayesian metrology.
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FY2001
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- Vangel, Mark (March, 2001). "Bayesian Multiple-Use
Calibration".
- Liu, Hung-Kung (December 2000). "Sensitivity Analysis
for BUGS in SRM Certifications".
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FY2000
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- Rukhin, Andrew (March 2000). "Noninformative Prior
Distributions".
- Liu, Hung-kung and Zhang, Nien Fan (March 2000).
"Combining Results from Multiple Methods: Bayesian
Inference of a Redundant Parameter".
- Hagwood, Charles (January 2000). "Bayesian Prediction
and Calibration".
- Hagwood, Charles (November 1999). "Tolerance Intervals:
Frequentist/Bayesian II".
- Hagwood, Charles (November 1999). "Tolerance Intervals:
Frequentist/Bayesian I".
- Yen, James (October 1999). "Maximum Entropy Prior
Distributions".
- Liu, Hung-kung (October 1999). "Empirical Bayes
Methods".
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FY1999
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- Eberhardt, Keith (September 1999). "Bayesian Analysis
of the Uncertainty of the Difference of two quantities".
- Vangel, Mark (August 1999). "Analysis of SRM 1975,
Diesel Extract: A Lesson in using BUGS Bayesian
software".
- Vangel, Mark (July 1999). "Notes on a Bayesian Approach
to a Logistic Regression Tolerance Limit Problem,
with Applications to Evaluating Home Lead-Test Kits".
- Eberhardt, Keith (March 1999). "Fully Bayesian BOB".
- Levenson, Mark (March 1999). "The Two-Method SRM
Problem".
- Levenson, Mark (January 1999). "Frequentist and
Bayesian Interpretations of the ISO Guide to the
Expression of Uncertainty in Measurement: An
Illustrative Example".
- Liu, Hung-kung and Zhang, Nien Fan (November 1998).
"SRM Certification by Two Measurement Methods: A "Type
B Bayesian" Approach".
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Date created: 8/28/2001
Last updated: 8/28/2001
Please email comments on this WWW page to
sedwww@nist.gov.
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