Bayesian Metrology Overview

Overview of Bayesian Metrology
Overview of Bayesian Metrology	This section discuusses what Bayesian metrology is, why it is important, and how we can apply Bayesian metrology to NIST measurement problems. What is Statistical Metrology? What is Bayesian Metrology? Why is Bayesian Metrology important? What are the benefits of Bayesian metrology? How does Bayesian Metrology work? What tools/software can we use to implement Bayesian metrology? What are the planned future developments and activities in Bayesian metrology? What are the cautions in applying the Bayesian approach to metrology problems?

	The above graph contains a link to a Bayesian analysis of the Michelson light data (in PDF format). If you cannot view PDF format files from your browser, the Adobe Acrobat Reader can be freely downloaded. You may also contact the SED webmaster to request a printed copy of the document.
Date created: 8/28/2001 Last updated: 9/12/2001 Please email comments on this WWW page to sedwww@nist.gov.

Overview of Bayesian Metrology