Publications Related to the Bayesian Metrology Project

Note: A few of these publications link to documents that are in the Portable Document Format (PDF). If you do not have the ability to view PDF format files from your browser, the Adobe Acrobat Reader can be freely downloaded. You may also contact the SED webmaster to request a printed copy.

• Toman, B. (2002) "Statistical Analysis of the Results of the CCPR Key Comparison on Near-Infrared Spectral Responsivity," for submission to Metrologia.

• Hagwood, R.C. (2002) "Bayesian Pressure Calibration," for submission to Technometrics.

• Liu, H. K. and Zhang, N. F. (2001) "A Bayesian Approach to Combining Results from Multiple Methods," Proceedings of the American Statistical Association.

• Toman, B. (2001) "Bayesian Sample Size Calculation," Proceedings of the American Statistical Association.

• Vangel M. G. (2001) "Interlaboratory Studies," in Encyclopedia of Envirometrics, eds. El-Sharaawi, A. H. and Piegorsch, W. W., John Wiley and Sons, New York.

• Rukhin, A. L., Biggerstaff, Brad J., and Vangel, M. G. (2000) "Restricted Maximum Likelihood Estimation of a Common Mean and the Mandel-Paule Algorithm", Journal of Statistical Planning and Inference, 83, 319-330.

• Coakley, K. J. and Levenson, M. S. (2000) "Adaptive Use of Prior Information in Inverse Problems: An Application to Neutron Depth Profiling", Measurement Science and Technology, 11:3, pp. 278-284.

• Levenson, M. S., Banks, D. L., Gill, L. M., Guthrie, W. F., Liu, H. K., Vangel, M. G., Yen, J. H., and Zhang, N. F. (2000) " An ISO GUM Approach to Combining Results from Multiple Methods", Journal of Research of the National Institute of Standards and Technology, 105, 571.

• Rossiter, W. R., Vangel, M. G. and McKnight, M. (2000) "Spot Test Kits for Lead in Household Paint: A Laboratory Evaluation," NIST Internal Report 6398, National Institute of Standards and Technology, 94 pp.

• Banks, D. L. and Eberhardt, K. R. (1999) "Equating Laboratories: Modeling and Analysis", Conference Record of the 16th IEEE Instrumentation and Measurement Technology Conference (on CD-ROM), May, 1999, Venice, Italy.

• Vangel, M. G. and Rukhin, A. L. (1999) "Maximum-Likelihood Analysis for Heteroscedastic One-Way Random Effects ANOVA in Interlaboratory Studies", Biometrics, 55, 302-313.

• Vangel, M. G. and Rukhin, A. L. (1999) "Hierarchial Models for Combining Information in Interlaboratory Studies", submitted to Bayesian Statistics 6, Bernando, J. Dawid, A., and Smith, A. (ed). Oxford University Press.

• Levenson, M. S., Eberhardt, K. R., Phillips, S. D, and Estler, W. T. (1998) " Calculation of Measurement Uncertainty Using Prior Information", Journal of Research of the National Institute of Standards and Technology, Vol. 103, No. 6.

• Vangel, M. G. and Rukhin, A. L. (1998) "Estimation of a Common Mean and Weighted Mean Statistics", Journal of the American Statistical Association, 93, 303-309.

Date created: 8/28/2001
Last updated: 9/25/2001
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