JRC Program

WEDNESDAY, MAY 29, 1996

8:00 am - 9:00 am Registration / Coffee & Rolls

9:00 am - 9:20 am Welcoming Remarks

9:20 am - 10:20 am Plenary Session:

Session Chair: Raghu Kacker, NIST

Statistics in Industry: Research Opportunities & Challenges

Vijayan N. Nair

Dept. of Statistics, Univ. of Michigan

10:20 am - 10:40 am Break

10:40 am - 12:30 pm Invited Session: Recent Advances in Design & Analysis of Experiments

Organizer: Don X. Sun, Bell Laboratories

Session Chair: Dennis Lin, Pennsylvania State Univ.

Multipanel Conditioning: Modeling Data from Designed Experiments

William S. Cleveland

Statistical Models & Methods Research Dept., Bell Laboratories

Montserrat Fuentes

Dept. of Statistics, Univ. of Chicago

Interaction Between Practical Experimentation & Design Theory: Some Recent Advances & Experience

Jeff Wu

Dept. of Statistics, Univ. of Michigan

10:40 am - 12:30 pm Invited Session: Probabilistic Methods in Image Analysis

Organizer/Session Chair: Jagdish Chandra, Army Research Office

Image Understanding via Deformable Templates: From Representation to Inference

Michael I. Miller,

Dept. of Electrical Engineering, Washington Univ.

Statistical Inference Problems in Computer Vision

Stuart Geman

Basilis Gidas

Donald McClure

Div. of Applied Math, Brown Univ.

10:40 am - 12:30 pm Contributed Session: Process Monitoring & Control

Session Chair: Hung-kung Liu, NIST

Statistical Process Control of Multivariable Dynamical Processes Using Automated Time Series Analysis

Wallace E. Larimore

Adaptics, Inc.

Nancy J. Kirkendall

Energy Information Administration

Automated System Monitoring & Diagnosis via Singular Value Decomposition

John L. Maryak

Applied Physics Laboratory, Johns Hopkins Univ.

Model-Free Control of General Processes

James C. Spall

John A. Cristion

Applied Physics Laboratory, Johns Hopkins Univ.

Efficiency & Robustness of Discrete PI Control Schemes

Fugee Tsung

Dept. of Industrial & Operations Engineering, Univ. of Michigan

10:40 am - 12:30 pm Contributed Session: Statistical Methods in Quality Improvement

Session Chair: Carroll Croarkin, NIST

A Designed Experiment for 747 Aircraft "Hump Section" Frame Mismatch

Bob Haukap

Process Engineering, Boeing Commercial Airplane Group

What a Difference a Day Makes: Before & After a Deming Lecture in Ex-Yugoslavia

Charles J. Stiffler

Vesna Luzar-Stiffler

Croation Applied Industrial Research Center

Structural Models & Operational Measures in Analyzing Customer Satisfaction

Jarrett K. Rosenberg

Sun Microsystems

Using Basic Statistical Thinking in Industrial Situations

Bob Haukap

Process Engineering, Boeing Commercial Airplane Group

12:30 pm - 1:45 pm Lunch

1:45 pm - 3:35 pm Invited Session: Statistical Monitoring of Autocorrelated Processes

Organizer/Session Chair: Ali Cinar, Illinois Institute of Technology

Statistical Monitoring of Continuous Processes

Antoine Negiz

Data, Delivery & Analysis Center, UOP

Ali Cinar

Dept. of Chemical Engineering, Illinois Institute of Technology

Residual-Based Monitoring of Autocorrelated Processes

Scott A. Vander Wiel

Statistical Models & Methods Research Dept., Bell Laboratories

1:45 pm - 3:35 pm Invited Session: Statistics in Information Technology

Organizer: Gordon Lyon, NIST

Session Chair: Jon Kettenring, Bellcore

Network Traffic Self-Similarity & the World Wide Web

Mark E. Crovella

Dept. of Computer Science, Boston Univ.

Lessons Learned in Developing & Applying Software Reliability & Metrics Models: NASA Space Shuttle Example

Norman F. Schneidewind

Dept. of Information Sciences, Naval Postgraduate School

1:45 pm - 3:35 pm Contributed Session: Experiment Design Applications

Session Chair: Jim Filliben, NIST

Case Studies in Design & Analysis of Computer Experiments

Andrew J. Booker

Research & Technology Dept., Boeing Information & Support Services

Applying "Incomplete" Selective t-Covering Experimental Designs to Software Testing

I. S. Dunietz

W. K. Ehrlich

B. D. Szablak

Operations Technology Center, AT&T

C. L. Mallows

Statistics Research Dept., AT&T Bell Laboratories

A. Iannino

Pipeline Associates

Field Optimization Using Response Surfaces

Timothy Tan

Foo Say Wei

Dept. of Electrical Engineering, National Univ. of Singapore (NUS)

Yaacob Ibrahim

Dept. of Industrial & Systems Engineering, NUS

Loh Han Tong

Dept. of Mechanical & Production Engineering, NUS

Reliability Improvement of Disk Drives Through Multiresponse Experiments

Vijendra P. Singh

Seagate Technology

Manesh Shah

International Pressure Vessel Inc.

Jagdish S. Rustagi

Dept. of Statistics, Ohio State Univ.

1:45 pm - 3:35 pm Contributed Session: Regression: Design & Analysis

Session Chair: Brad Biggerstaff, NIST

Informational Complexity Approach to Predictive Regression Models of Future Observations

Hamparsum Bozdogan

Dept. of Statistics, Univ. of Tennessee

Latent Variable Methods for Multivariate Regression with Applications in Chemistry & Chemical Engineering

Alison J. Burnham

Roman Viveros

Dept. of Mathematics & Statistics, McMaster Univ.

John F. MacGregor

Dept. of Chemical Engineering, McMaster Univ.

On Estimation in Linear Calibration Problems

Jinzhong Liao

Dept. of Statistics, Univ. of Michigan

Bayesian D-Optimal Designs for Heteroscedastic Polynomial Models

Holger Dette

Faculty of Mathematics, Ruhr Univ.

Weng Kee Wong

Dept. of Biostatistics, Univ. of California - Los Angeles

3:35 pm - 3:55 pm Break

3:55 pm - 5:45 pm Invited Session: Accelerated Testing

Organizer: Vijayan N. Nair, Univ. of Michigan

Session Chair: Nozer Singpurwalla, George Washington Univ.

Operational Statistical Lifetime Models for Engineering Design & Accelerated Testing

Stephen E. Chick

Dept. of Industrial Engineering, Univ. of Michigan

Accelerated Degradation Test Modeling & Analysis

William Q. Meeker

Dept. of Statistics, Iowa State Univ.

3:55 pm - 5:45 pm Invited Session: Process Capability

Organizer: Nien Fan Zhang, NIST

Session Chair: Jim Landwehr, AT&T Bell Laboratories

Process Capability Indices in the Semiconductor Industry

Catherine Lewis

Veronica Czitrom

Quality Assurance Dept., AT&T Microelectronics

Some Issues in Applications of Process Capability Indices

Nien Fan Zhang

Statistical Engineering Div., NIST

3:55 pm - 5:45 pm Contributed Session: Statistical Issues in Sampling

Session Chair: Keith Eberhardt, NIST

Estimating the Precision of On-Line Coal Analyzers

Fred Lombard

Dept. of Statistics, Rand Afrikaans Univ.

G. J. Lyman

Dept. of Mining & Metallurgical Engineering, Univ. of Queensland

Defect Rate Estimation & Cost Minimization Using Acceptance Sampling with Rectification

Neerja Wadhwa

Dept. of Management Science & Information Systems, Univ. of Texas

Statistical Issues in Nondestructive Materials Evaluation & Related Problems of Sampling Inspection & Standardization

George Zeliger

Anvical-Simplex

3:55 pm - 5:45 pm Contributed Session: Image Analysis

Session Chair: Kevin Coakley, NIST

Efficient Estimation of Process Parameters from Image Sensor Data

Daniel C. Chin

Applied Physics Laboratory, Johns Hopkins Univ.

A Markovian Approach to Microstructure Modeling of Plasma-Sprayed Coatings

Robert E. Derr

Chuanshu Ji

Dept. of Statistics, Univ. of North Carolina

Development of a Particle-in-Oil Standard for the National Fluid Power Industry

R. A. Fletcher

J. R. Verkouteren

E. S. Windsor

D. S. Bright

E. B. Steel

J. A. Small,

Surface & Microanalysis Science Div., NIST

W. S. Liggett

Statistical Engineering Div., NIST

Adaptive Smoothing of Images with Local Weighted Regression

Mark S. Levenson

Statistical Engineering Div., NIST

David S. Bright

Surface & Microanalysis Div., NIST

Jayaram Sethuraman

Dept. of Statistics, Florida State Univ.

6:30 pm - 8:30 pm Mixer

THURSDAY, MAY 30, 1996

8:50 am - 9:20 am Coffee & Rolls

9:20 am - 10:20 am Plenary Session:

Session Chair: Eric Lagergren, NIST

The Needs of Industry, Engineering & Science for Statistics in the Emerging Millennium

William A. Golomski

W. A. Golomski & Associates

10:20 am - 10:40 am Break

10:40 am - 12:30 pm Invited Session: Robust Design

Organizer: Subir Ghosh, Univ. of California - Riverside

Session Chair: Scott Vander Wiel, Bell Laboratories

Applications of the Robust Method at Ford

John J. King

Ford Design Institute

10:40 am - 12:30 pm Invited Session: Statistics at SEMATECH

Organizer: Paul Tobias, SEMATECH

Session Chair: George Milliken, Kansas State Univ.

Identifying the Source of Light Point Defects

Jack E. Reece

Statistical Methods Group, SEMATECH

Georgia L. Dempsey

Process Engineering Group, SEMATECH

Deciding Among Competing Process Flows

Georgia L. Dempsey

Process Engineering Group, SEMATECH

Jack E. Reece

Statistical Methods Group, SEMATECH

10:40 am - 12:30 pm Contributed Session: Reliability Analysis

Session Chair: Asit Basu, Univ. of Missouri

Complex Systems of Weibull Components

James D. Lynch

Dept. of Statistics, Univ. of South Carolina

Failure Models for Fibrous Composite Materials Based on Cumulative Damage Arguments

William J. Padgett

Dept. of Statistics, Univ. of South Carolina

A Family of Alternative Discrete Reliability Growth Models Based on Duane Learning Curve Property

Ananda Sen

Dept. of Mathematical Sciences, Oakland Univ.

Arthur Fries

Institute for Defense Analyses

Some New Inference Procedures for the Censored Two-Sample Accelerated Life Model

Song Yang

Dept. of Mathematics, Texas Tech Univ.

10:40 am - 12:30 pm Contributed Session: One-Way Models in Engineering Applications

Session Chair: Stefan Leigh, NIST

One-Way Analysis Strategies for Cylindrical Data

Christine M. Anderson-Cook

Dept. of Statistics & Actuarial Sciences, Univ. of Western Ontario

Repeatability & Reproducibility for Pass/Fail Data

John Mandel

Chemical Science & Technology Laboratory, NIST

New Results for the Analysis of a Series of Similar Experiments

Mark G. Vangel

Statistical Engineering Div., NIST

Andrew L. Rukhin

Dept. of Mathematics & Statistics, Univ. of Maryland-Baltimore

Analysis of a Series of Similar Experiments: Bayesian Approach, Variance Bounds & Asymptotic Study

Andrew L. Rukhin

Dept. of Mathematics & Statistics, Univ. of Maryland-Baltimore

Mark G. Vangel

Statistical Engineering Div., NIST

12:30 pm - 1:45 pm Lunch

1:45 pm - 3:35 pm Invited Session: Response Surface Modeling

Organizer: Jayant Kalagnanam, Carnegie Mellon Univ.

Session Chair: Jerry Sacks, National Institute of Statistical Sciences

IC Quality as a High-Dimensional Response Surface

Andrzej J. Strojwas

Dept. of Electrical & Computer Engineering, Carnegie Mellon Univ.

The Comparative Performances of New Wave Response Surface Analyses: An IC Example

David Banks

Dept. of Statistics, Carnegie Mellon Univ.

1:45 pm - 3:35 pm Invited Session: Measurement of Particle Size

Organizer/Session Chair: Robert Fletcher, NIST

Standardization for Particle Size Distribution Determination

Mohsen A. Khalili

Central R&D, E. I. du Pont de Nemours & Co.

Experimental Characterization of Optical Particle Counters

Walter Liggett

Statistical Engineering Div., NIST

Robert Fletcher

Surface & Microanalysis Science Div., NIST

1:45 pm - 3:35 pm Contributed Session: Control Charts in Advanced SPC

Session Chair: Grace Yang, Univ. of Maryland - College Park

ARL-Unbiased Control Charts for Monitoring the Fraction of Nonconforming Units

Cesar A. Acosta-Mejia

Dept. of Administration, Mexican Autonomous Institute of Technology

The Effect of Autocorrelation in the Multivariate T-Squared Control Chart

Francisco Aparisi

Dept. of Statistics, Polytechnical Univ. of Valencia

Multivariate Control Charts Based on Data Depth

Regina Y. Liu

Dept. of Statistics, Rutgers Univ.

A Nonparametric Control Chart for Multivariate Data

J. T. Chang

R. D. Fricker, Jr.

Dept. of Statistics, Yale Univ.

1:45 pm - 3:35 pm Contributed Session: Stochastic Process Optimization

Session Chair: Charles Hagwood, NIST

Simulation-Based Optimization of Queuing Networks

Stacy D. Hill

Applied Physics Laboratory, Johns Hopkins Univ.

Michael C. Fu

Univ. of Maryland

Optimization of Integral-Based Loss Functions via Simultaneous Perturbation Stochastic Approximation

Nathan L. Kleinman

Johns Hopkins Univ.

Evaluation of a Stochastic Signal Timing Estimation Technique for System-Wide Traffic Control

Richard H. Smith

Daniel C. Chin

Applied Physics Laboratory, Johns Hopkins Univ.

Optimal Sensor Placement for Complex Systems

Payman Sadegh

Institute of Mathematical Modeling, Technical Univ. of Denmark

James C. Spall

Applied Physics Laboratory, Johns Hopkins Univ.

3:35 pm - 3:55 pm Break

3:55 pm - 5:45 pm Invited Session: Statistics in Chemical Engineering

Organizer/Session Chair: Tim Read, E. I. du Pont de Nemours & Co.

Process Understanding & Control Using Multivariate Statistics

Albert S. Tam

Michael J. Piovoso

Central R&D, E. I. du Pont de Nemours & Co.

Prediction Intervals for Artificial Neural Networks

Richard D. De Veaux

Dept. of Mathematics, Williams College

Lyle H. Ungar

Dept. of Chemical Engineering, Univ. of Pennsylvania

3:55 pm - 5:45 pm Tutorial:

Organizer/Session Chair: Lisa Gill, NIST

Application of Exploratory Data Analysis in a Scientific & Engineering Environment

James J. Filliben

Statistical Engineering Div., NIST

3:55 pm - 5:45 pm Contributed Session: Experiment Design

Session Chair: Joan Rosenblatt, NIST

2^{n-m} Designs with Minimum Aberration

Hegang Chen

Dept. of Epidemiology & Biostatistics, Case Western Reserve Univ.

Algorithmic Construction of Optimal Mixed-Level Designs

William W. Li

Reliability Methods Dept., Ford Motor Company

Estimation Capacity Aspects of Experimental Designs

Don X. Sun

Statistical Models & Methods Research Dept., Bell Laboratories

Exact Optimal Designs on a Circle or a Circular Arc

Huaiqing Wu

Dept. of Statistics, Univ. of Michigan

3:55 pm - 5:45 pm Contributed Session: Process Characterization

Session Chair: Jack Wang, NIST

Statistical Geometrical Methods in Paper Formation

Min Deng

Dept. of Mathematics, Univ. of Wisconsin - Stevens Point

C. T. J. Dodson

Dept. of Mathematics, Univ. of Toronto

Statistical Characterization of Light Point Defects on Silicon Wafers

Peter C. Pankratz

Technology Dept., MEMC Electronic Materials Inc.

Multivariate Process Capability Analysis

Vani H. Sundaraiyer

Dept. of Mathematics, Univ. of Northern Iowa

Analyzing Temporally Dependent Ordered Categorical Data

Vijayan N. Nair

Chuanguo Wang

Dept. of Statistics, Univ. of Michigan

FRIDAY, MAY 31, 1996

8:30 am - 9:00 am Coffee & Rolls

9:00 am - 10:50 am Invited Session: Statistical Thinking for Business Improvement

Organizer: Lynne B. Hare, NIST

Statistical Thinking for Business Improvement: Definition & Overview

Ronald D. Snee

Joiner Associates

Lynne B. Hare

Statistical Engineering Div., NIST

Roger W. Hoerl

Management Science & Statistics, General Electric R&D

Statistical Thinking for Business Improvement: Implementation

Lynne B. Hare

Statistical Engineering Div., NIST

Roger W. Hoerl

Management Science & Statistics, General Electric R&D

Ronald D. Snee

Joiner Associates

9:00 am - 10:50 am Invited Session: Integrated Circuit Burn-in Issues

Organizer/Session Chair: Way Kuo, Texas A & M Univ.

Problems Associated with Burn-in Tests

Dave Grosch, Jon Butkus

Microelectronics Div., IBM Corp.

Some Models in Burn-in

Jie Mi

Dept. of Statistics, Florida International Univ.

9:00 am - 10:50 am Contributed Session: Robust Design

Session Chair: Walter Liggett, NIST

SN Ratios & Other Measures: A Comparison

Julie Berube

Dept. of Statistics, Univ. of Michigan

Selection & Screening Procedures for Robust Product Design

Guohua Pan

Dept. of Mathematical Sciences, Oakland Univ.

Thomas J. Santner

Dept. of Statistics, Ohio State Univ.

Mixture Experiments in the Presence of Noise Factors & Measurement Error

Stefan H. Steiner

Dept. of Statistics, Univ. of Waterloo

Multivariate Robust Designs: A Response Surface Approach

Suat Tanaydin

Dept. of Statistics, Purdue Univ.

9:00 am - 10:50 am Special Contributed Session: Statistics at the Indian Statistical Institute

Session Organizer: B. K. Pal, Indian Statistical Institute

Session Chair: Raghu Kacker, NIST

Optimisation of Concrete Strength Using Mixture Designs: An Application

Somnath Ray

Indian Statistical Institute

Sensitivity of SN Ratios Analyses: A Case Study

J. Venkatappaiah

Indian Statistical Institute

10:50 am - 11:10 am Break

11:10 am - 12:50 pm Plenary Panel Session:

Organizer/Session Chair: Robert G. Easterling, Sandia National Laboratories

Computer Models & Data Interface: Development, Validation & Inference
Panel Members Include:

Michael Cohen

Committee on National Statistics, National Academy of Sciences

Dennis Cox

Dept. of Statistics, Rice Univ.

Andrew Booker

Research & Technology Dept., Boeing Information & Support Services

Alan Karr

National Institute of Statistical Sciences

12:50 pm - 1:00 pm Closing Remarks