Acknowledgements for the NIST/SEMATECH e-Handbook of Statistical Methods

Origins of the e-Handbook in the Work of Mary Natrella

• Carroll Croarkin - Statistical Engineering Division, Information Technology Laboratory, NIST
  
• Paul Tobias - Statistical Methods Group, SEMATECH

1. Exploratory Data Analysis:
   • James J. Filliben - Statistical Engineering Division, Information Technology Laboratory, NIST
2. Measurement Process Characterization:
   • Carroll Croarkin - Statistical Engineering Division, Information Technology Laboratory, NIST
3. Production Process Characterization:
   • Barry Hembree - AMD
4. Process Modeling:
   • William Guthrie - Statistical Engineering Division, Information Technology Laboratory, NIST
5. Process Improvement:
   • Paul Tobias - Statistical Methods Group, SEMATECH
   • Ledi Trutna - Advanced Micro Devices
6. Process or Product Monitoring and Control:
   • Jack Prins - Statistical Methods Group, SEMATECH
7. Product and Process Comparisons:
   • Jack Prins - Statistical Methods Group, SEMATECH
8. Assessing Product Reliability:
   • Paul Tobias - Statistical Methods Group, SEMATECH

• Chelli Zey - Statistical Methods Group, SEMATECH

1. Exploratory Data Analysis:
   • James J. Filliben - Statistical Engineering Division, Information Technology Laboratory, NIST
   • Alan Heckert - Statistical Engineering Division, Information Technology Laboratory, NIST
2. Measurement Process Characterization:
   • Carroll Croarkin - Statistical Engineering Division, Information Technology Laboratory, NIST
3. Production Process Characterization:
   • Barry Hembree - AMD
4. Process Modeling:
   • William Guthrie- Statistical Engineering Division, Information Technology Laboratory, NIST
   • James Filliben- Statistical Engineering Division, Information Technology Laboratory, NIST
   • Alan Heckert- Statistical Engineering Division, Information Technology Laboratory, NIST
5. Process Improvement:
   • Ledi Trutna - Advanced Micro Devices
   • Pat Spagon - Motorola University
   • Dr. Enrique del Castillo - Department of Industrial & Manufacturing Engineering, Pennsylvania State University
   • Terri Moore - Motorola
   • Sam Hartley - Motorola
   • Arnon Hurwitz - QualTech Motorola
6. Process or Product Monitoring and Control:
   • Jack Prins - Statistical Methods Group, SEMATECH
7. Product and Process Comparisons:
   • Jack Prins - Statistical Methods Group, SEMATECH
   • Don McCormack - Statistical Methods Group, SEMATECH
   • Di Michelson - Statistical Methods Group, SEMATECH
   • Karen Horrell - Statistical Methods Group, SEMATECH
8. Assessing Product Reliability:
   • Paul Tobias - Statistical Methods Group, SEMATECH

• Tom Ryan - NIST: external staff
• Keith Eberhardt - Statistical Engineering Division, Information Technology Laboratory, NIST
• Dom Vecchia - Statistical Engineering Division, Information Technology Laboratory, NIST
• Nien-Fan Zhang - Statistical Engineering Division, Information Technology Laboratory, NIST
• Jolene Splett - Statistical Engineering Division, Information Technology Laboratory, NIST
• Jack Wang - Statistical Engineering Division, Information Technology Laboratory, NIST
• David Banks - Statistical Engineering Division, Information Technology Laboratory, NIST
• Mark Levenson - Statistical Engineering Division, Information Technology Laboratory, NIST

• Alan Heckert - Statistical Engineering Division, Information Technology Laboratory, NIST
• Cesar Iriarte - Iris Visual Design
• George Kaupas - AMD
• Mark Reeder - Statistical Engineering Division, Information Technology Laboratory, NIST
• Chelli Zey - Statistical Methods Group, SEMATECH

• Cesar Iriarte - Iris Visual Design

• James J. Filliben - Statistical Engineering Division, Information Technology Laboratory, NIST
• Alan Heckert - Statistical Engineering Division, Information Technology Laboratory, NIST
• Robert Lipman - Building and Fire Research Laboratory, NIST

• James Ehrstein - NIST: Check standard for resistivity measurements
• James Ehrstein - NIST: Gauge Study of Resistivity Probes
• Paul Pontius - NIST: Load Cell Calibration