This is the data file MONITOR-6_3_3_1.DAT Source: This example is used on page pmc331.htm of the e-Handbook to demonstrate counts-based control charts. Description: The data consists of 25 wafers where each wafer contains 100 chips. For each wafer, we count the number of defective chips. To read into Dataplot, enter SKIP 25 READ "MONITOR-6_3_3_1.DAT" waferid defects Wafer Number of ID Defects ---------------- 1 16 2 14 3 28 4 16 5 12 6 20 7 10 8 12 9 10 10 17 11 19 12 17 13 14 14 16 15 15 16 13 17 14 18 16 19 11 20 20 21 11 22 19 23 16 24 31 25 13