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2.
Measurement Process Characterization
2.6. Case studies 2.6.2. Check standard for resistivity measurements 2.6.2.1. Background and data
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| Description of check standard |
A single wafer (#137), chosen at random from a batch of 130 wafers, is
the check standard for resistivity measurements at the 100 ohm.cm level
at the National Institute of Standards and Technology. The average of
six measurements at the center of the wafer is the check standard value
for one occasion, and the standard deviation of the six measurements is
the short-term standard deviation. The columns of the database
contain the following:
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| Database of measurements on check standard |
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