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Contact
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Dom
Vecchia
Statistical Engineering
Division
Information Technology
Laboratory
303-497-3807
dom.vecchia@.nist.gov
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Impetus/Customers
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Large signal descriptions are now required as wireless networks are
pushed beyond the limits of linear analysis. The complexity of the
resulting problems demand multi-disciplinary solutions. NIST is
beginning to address these needs and has established a new measurement
facility for device level characterizations. However, the
techniques being investigated under the existing program are limited by
measurement uncertainty in the phase information and require an
external validation to push to higher frequencies. In addition,
general modeling techniques for nonlinear components at the system
level are inadequate and do not exploit the wealth of measurement data
that is now available at the device level.
Every segment of the wireless community, both in existing commercial
systems and higher-frequency links now being considered.
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Objective(s)
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The objective of this project is to advance the state of the art in
measurement and modeling of high frequency wireless systems and
components under large signal conditions. Develop and verify a
standard nonlinear device with large-signal response that can be
predicted from underlying physical principles; develop a
measurement-based model, and validate by comparing system simulation
predictions to those based on a physical model. Produce methods and
software for instrument calibration and system simulations;
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Staffing Profile and Funding
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FTE = 0.8
Expected funding is for $165K ATP.
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Timeline/
Milestones
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The timelines and milestones for this project are:
- FY01: Quantify fundamental nonlinear response for standard
nonlinear device(s); Complete phase uncertainty study of
Nonlinear Network Measurement System (NNMS) data.
- FY02: Validate/verify NNMS-based model of standard devices;
have system models and simulation capabilities in place.
- FY03: Demonstrate that statistical model and physical model
culminate in consistent system response predictions.
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Additional Information
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