Jack C.M. Wang
Statistical Engineering Division, CAML
Paul A. Williams
Kent B. Rochford
Alan H. Rose
Optoelectronics Division, EEEL
Optical communication, data storage, ellipsometry, sensor and other
optoelectronic systems often use linear retarders to control or analyze
optical signals. Often these systems require retarders with specific
and/or accurately known values of retardance. NIST is developing a
quarterwave linear retarder designed to have a retardance stable within
over a variety of operational and environmental conditions.
Three methods are used to measure retardance. One of the methods uses
a modified version of standard polarimetric measurements and uses
rotating polarizers.
Linearly polarized light, with known orientation, is incident on
the retarder and the light emerges with an elliptical polarization.
The intensities of the perpendicular and parallel states of the
emerging light are measured.
Measurements are made as the input polarizer rotating from
to
with increments of
.
Let
,
be the ith orientation of
the input polarizer, and Ri be the square root of the ratio of
the measured perpendicular intensity to the measured parallel intensity
at angle
.
Define
,
a model relating
Yi and
is given by
where
are random noise,
and
are parameters to be estimated.
In particular,
is the retardance parameter.
Many (112) experiments were run to determine the retardance
of 5 rhombs. A brief summary of the findings is given below.
- Due to experimental conditions and other interfering factors,
the retardance parameter may vary from experiment to experiment.
Estimates were obtained under a random-coefficients model
assumption.
- Since the model is periodic in
with a periodicity
of
,
the pooled rotation error variance was used
to test the lack-of-fit for each experiment.
- The phase estimate
was found to be related to some
of the experimental conditions and could be used to screen the
experiments.
- A downward trend of retardance estimates was detected for the
earlier experiments. Further investigations indicated that
some experiments were not properly run.
- The goal of retardance measurement with uncertainty less than
is reachable with this system.
Figure 10: The top figure displays the measurement results of intensity ratio
vs. polarizer orientation for a typical experiment. The dotted
line is the least-squares fit of the model. The bottom plots
the rotation and residual errors for each experiment. It shows,
for most cases, the residual error is smaller than the rotation
error, indicating that the model is adequate for the data.