6.1.1 Publications in Print

1.

D.L. Banks (co-editor with S. Kotz and C.B. Read). Encyclopedia of Statistical Sciences, Update Volume 1, 1997.

2.

D.L. Banks (co-editor with S. Kotz and C.B. Read). Encyclopedia of Statistical Sciences, Update Volume 2, 1998.

3.

D.L. Banks (with T. Kurfess and L. Wolfson) A multivariate statistical approach to metrology, Journal of Manufacturing Science and Engineering, 118, 1996, p. 652-658.

4.

D.L. Banks (with W. Shannon) An MLE strategy for combining CART models, Proceeding of the 1997 Symposium on the Interface: Computing Science and Statistics, p. 227-232.

5.

D.L. Banks (with M. Scher, G. Dokianakis, D. Steppe, and R. Sclabassi) Computer classification of state in healthy preterm neonates, Sleep, 20, 1997, 132-141.

6.

K.J. Coakley, Nonequilibrium Kinetics of Neutral Atoms Confined in a Harmonic Potential, PHYSICA A, 234,1996, pp.407-426

7.

K.J. Coakley with (M.Holland,J.Williams, and J.Cooper), Trajectory Simulation of Kinetic Equations for Classical Systems, Quantum Semiclassical Optics, 8, 1996, pp.571-581

8.

K.J. Coakley, A Bootstrap Method for Nonlinear Filtering of EM-ML Reconstructions of PET Images, International  Journal  of  Imaging  Science  and  Technology, 7(1), 1996, pp.54-61

9.

K.J. Coakley and S. Wilson, Analysis of Asymmetry in Physics, Physical  Review  E, 53(4), 1996, pp. 2160-2168

10.

K.J. Coakley (with S.S.-C. Tai, R.G. Christiansen, P. Ellerbe, T. Long, M. Welch) The Certification of Phencyclidine in Lyophilized Human Urine Reference Materials, Journal  of  Analytical  Chemistry, 20, 1996, pp. 43-49

11.

K. Ehara, C.Hagwood and K.J.Coakley, Novel Method to Classify Aerosol Particles According to Their Mass-to-Charge Ratio," Journal  of  Aerosol  Science , Vol. 27, No. 2, pp.217-234, 1996

12.

C. Croarkin (with T.V. Vorburger, J. F. Song, C.H.W. Giauque, T.B. Renegar, E.P. Whitenton, Stylus-laser Surface Calibration System, Precision Engineering, 1996, p. 157-163.

13.

J.J. Filliben, (with K.C. Li) A systematic approach to the analysis of complex interaction patterns in two-level factorial design, Technometrics, 39 (3), 1997, pp. 286-297.

14.

L.M. Gill, J.J. Filliben, (with S. Jahanmir, L.K. Ives), Effect of Grinding on Strength of Sintered Reaction Bonded Silicon Nitride, 2nd International Conference on Machining of Advanced Materials (MAM), VDI Berichte 1276, (1996) pp.603-615.

15.

W.F. Guthrie (with M.W. Cresswell, R.A. Allen, L.W. Linholm, W.B. Penzes and A.W. Gurnell), Hybrid Optical-Electrical Overlay Test Structures, IEEE Transactions on Semiconductor Manufacturing, 10 (2), 1997.

16.

W.F. Guthrie (with N.J. Carino and G.M. Mullings), Evaluation of ASTM Standard Consolidation Requirements for Preparing High-Strength Concrete High Performance Concrete: Design and Materials and Recent Advances in Concrete Technology, ACI SP-172, Proc. of the Third ACI International Conf. on High-Performance Concrete, Kuala Lumpur, Malaysia, December 2-5, 1997, pp 733-768.

17.

W.F. Guthrie (with W.E. Lee, M.W. Cresswell, R.A. Allen, J.J. Sniegowski, and L.W. Linholm), Reference-Length Shortening by Kelvin Voltage Taps in Linewidth Test Structures Replicated in Monocrystalline Silicon Films, Proc. of IEEE International Conf. on Microelectronic Test Structures, Monterey, CA, March 17-28, 1997.

18.

W.F. Guthrie (with M.W. Cresswell, J.J. Sniegowski, R.N. Ghoshtagore, R.A. Allen and L.W. Linholm), Electrical Linewidth Test Structures Fabricated in Monocrystalline Films for Reference Material Applications, Proc. of IEEE International Conf. on Microelectronic Test Structures, Monterey, CA, March 17-28, 1997.

19.

W.F. Guthrie (with M.W. Cresswell, J.J. Sniegowski, R.N. Ghoshtagore, R.A. Allen, A.W. Gurnell, L.W. Linholm, R.G. Dixson, and E.C. Teague), Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes, Japanese Journal of Applied Physics December 1996, Vol. 35, Part 1, No. 12B, pp. 6597-6609.

20.

W.F. Guthrie (with M.W. Cresswell, R.A. Allen, L.W. Linholm, and A.W. Gurnell), Hybrid Optical-Electrical Overlay Test Structure, Proc. of IEEE International Conf. on Microelectronic Test Structures, Trento, Italy, March 25-28, 1996.

21.

W.F. Guthrie (with M.A. Shen, F. Mopsik, W. Wu, W.E. Wallace, N.C. Beck Tan, and G.T. Davis), Advances in the Measurement of Polymer CTE: Micrometer to Atomic-Scale Measurements, Proceedings of the 211th American Chemical Society National Meeting, Division of Polymer Chemistry, 37(1), New Orleans, LA, March 4, 1996, pp. 180-182.

22.

A. Heckert, (with E. Simiu), Extreme Wind Distribution Tails: A ''Peaks Over Threshold" Approach, Journal of Structural Engineering, May, 1996.

23.

M.S. Levenson (with T. Hopp), Performance Measures for Geometric Fitting in the NIST Algorithm Testing and Evaluation Program for Coordinate Measurement Systems, Journal of Research of the National Institute of Standards and Technology, Vol 100, No 5, 1995, pp. 563-574.

24.

M.S. Levenson (with D. Bentz, N. Martys, P. Stutzman, E. Garboczi, J. Dunsmuir, L. Schwartz), X-Ray Microtomography of an ASTM C109 Mortar Exposed to Sulfate Attack, Material Research Society Symposium Proceedings, Vol 370, 1995.

25.

M.S. Levenson, Removing Quantization Noise Using Wavelets, Proceedings of the Section on Physical and Engineering Sciences of the 1996 Joint Statistical Meetings, pp. 193-197.

26.

M.S. Levenson (with D. Bright, J. Sethuraman), Adaptive Smoothing of Images with Local Weighted Regression, Statistical and Stochastic Methods for Images Processing, Proceedings of the SPIE Conference, Vol 2823, 1996, pp. 85-99.

27.

M.S. Levenson and K.R. Eberhardt (with W.T. Estler, S.D. Phillips, B. Borchardt, T. Hopp, C. Witzgall, M. McClain, Y. Shen, X. Zhang), Error Compensation for CMM Touch Trigger Probes, Precision Engineering, Vol 19, No 2/3, 1996, pp. 85-97.

28.

M.S. Levenson, An Overview of Statistical Uncertainty Analysis, NIST Special Publication on the 1996 Measurement Quality Conference.

29.

M.G. Vangel and M.S. Levenson (with M. Behlke, R. Saraswati, E. Mackey, R. Demiralp, B. Porter, V. Mandic, S. Azemard, M. Horvat, K. May, H. Emons, S. Wise), Certification of Three Mussel Tissue Standard Reference Materials (SRMs) for Methylmercury and Total Mercury Content, Fresenius' Journal of Analytic Chemistry, Vol 358, No 3, 1997, pp. 431-440.

30.

M.S. Levenson and M.G. Vangel (with R.E. Scholten, R. Gupta, J.J. McClelland, R.J. Celotta), Laser Collimation of a Chromium Beam, Physics Review A, Vol 55, No 2, 1997, pp. 1331-1338.

31.

M.S. Levenson and K.R. Eberhardt (with S.D. Phillips, B. Borchardt, D. Sawyer, W.T. Estler, D. Ward, M. McClain, B. Melvin, T. Hopp, Y. Shen), The Calculation of CMM Measurement Uncertainty Via the Method of Simulation by Constraints, Proceedings of the American Society for Precision Engineering, Vol 16, 1997, p. 443.

32.

K.R. Eberhardt and M.S. Levenson (with R.G. Gann), Fabrics for Testing the Ignition Propensity of Cigarettes, Fire and Materials, Vol 21, 1997, pp. 259-61.

33.

M.S. Levenson and K.R. Eberhardt (with W.T. Estler, S.D. Phillips, B. Borchardt, T. Hopp, M. McClain, Y. Shen, X. Zhang), Practical Aspects of Touch Trigger Probe Error Compensation, Precision Engineering, Vol 21, No 1, 1998, pp. 1-17.

34.

M.S. Levenson and K.R. Eberhardt (with S.D. Phillips, W.T. Estler), Calculation of Measurement Uncertainty Using Prior Information, Journal of Research of the National Institute of Standards and Technology, to appear.

35.

H.K. Liu, (with K. Ehara) Background corrected statistical confidence intervals for particle contamination levels, Proceedings of the 13th International Symposium on Contamination Control 478-485, 1996.

36.

H.K. Liu, High-dimensional empirical linear prediction, Advanced Mathematical Tools in Metrology III, 79-90, 1997.

37.

M.G. Vangel, Confidence Limits for a Normal Coefficient of Variation, The American Statistician, 50, 1996, pp. 21-26.

38.

M.G. Vangel, Design Allowables From Regression Models Using Data From Several Batches, in STP 1274, Proceedings of the 12th Symposium on Composite Materials: Testing and Design, American Society for Testing and Materials, 1996.

39.

Mark Vangel (with Walter Rossiter, Kevin Kraft and Edward Embree), EPDM Membrane Seam Performance, Roofing and Building Insulators Contractors Guide, February, 1998, pp. 65-68.

40.

A.L. Rukhin and M.G. Vangel, Estimation of a Common Mean and Weighted Means Statistics, Journal of the American Statistical Association, 93, pp. 303-309, 1998.

41.

Mark G. Vangel (with Walter J. Rossiter, Kevin M. Kraft and Edward Embree), Performance of Tape-Bonded Seams of EPDM Membranes: The Effect of Load on Peel-Creep, in Fourth International Symposium on Roofing Technology: Challenges for the 21st Century, National Roofing Contractors Association, 1997, pp. 1-13.

42.

C.M. Wang, H.K. Iyer, Sampling plans for obtaining tolerance intervals in a balanced one-way random-effects model, Communications in Statistics - Theory and Methods, 25 (2), 1996, pp. 313-324.

43.

C.M. Wang, (with C.T. Lam), Confidence limits for proportion of conformance, Journal of Quality Technology, 28 (4), 1996, pp. 439-445.

44.

C.M. Wang, (with P.D. Hale, R. Park, W.Y. Lau), A transfer standard for measuring photoreceiver frequency response, Journal of Lightwave Technology, 14 (11), 1996, pp. 2457-2466.

45.

C.M. Wang, D.F. Vecchia, (with M. Young, N.A. Brilliant), Robust regression applied to optical fiber dimensional quality control, Technometrics, 39 (1), 1997, pp. 25-33.

46.

C.M. Wang, H.K. Iyer, (with E.B. Brown), Tolerance intervals for assessing individual bioequivalence, Statistics in Medicine, 16, 1997, pp. 803-820.

47.

C.M. Wang, (with A.H. Rose, S.M. Etzel), Verdet constant dispersion in annealed optical fiber current sensors, Journal of Lightwave Technology, 15 (5), 1997, pp. 803-807.

48.

C.M. Wang, (with K.B. Rochford, A.H. Rose), NIST study investigates retardance uncertainty, Laser Focus World, May, 1997, pp. 223-227.

49.

C.M. Wang, (with J.D. Splett), Consensus values and reference values illustrated by the Charpy machine certification program, Journal of Testing and Evaluation, 25 (3), 1997, pp. 308-314.

50.

C.M. Wang, (with C.T. Lam), A mixed-effects model for the analysis of circular measurements, Technometrics, 39 (2), 1997, pp. 119-126.

51.

C.M. Wang, (with K.B. Rochford, A.H. Rose, P.A. Williams, I.G. Clarke, P.D. Hale, G.W. Day), Design and performance of a stable linear retarder, Applied Optics, 36, (25), 1997, pp. 6458-6465.

52.

C.M. Wang, (with P.A. Williams, A.H. Rose), Rotating-polarizer polarimeter for accurate retardance measurement, Applied Optics, 36, (25), 1997, pp. 6466-6472.

53.

C.M. Wang, (with K.B. Rochford), Accurate interferometric retardance measurements, Applied Optics, 36, (25), 1997, pp. 6473-6479.

54.

N.F. Zhang, A Statistical Control Chart for Stationary Process Data, Technometrics, 40, 1998, pp. 24-38.

55.

N.F. Zhang, (with M.T. Postek, R.D. Larrabee), Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments, Metrologia, 34, 1997.

56.

N.F. Zhang, Detection Capability of Residual Control Chart for Stationary Processes, Journal of Applied Statistics , 24(4), 1997, pp. 475-492.

57.

N.F. Zhang, Autocorrelation Analysis of Some Linear Transfer Function Models and Its Applications in the Dynamic Process Systems, Lectures in Applied Mathematics, 33, 1997, pp. 385-399.

58.

N.F. Zhang, (with M.T. Postek, R.D. Larrabee, A.E. Vladar, W.J. Keery, S.N. Jones), A Statistical Measure for the Sharpness of SEM Images, Proceedings of SPIE, 1997, vol. 2050, pp. 375-386.

59.

N.F. Zhang, Estimating Process Capability Indices for Autocorrelated Processes, Proceedings of the Section on Quality and Productivity of American Statistical Society, 1996, pp. 49-54.

60.

N.F. Zhang, (with M.T. Postek, R.D. Larrabee, L. Carroll, W.J. Keery), A New Algorithm for the Measurement of Pitch in Metrology Instruments, Proceedings of SPIE, 1996, vol. 2725, pp. 147-158.

       

Date created: 7/20/2001
Last updated: 7/20/2001
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