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6.1.2 NIST Technical Reports

1.
C. Croarkin (with J. R. Ehrstein), Standard Reference Materials: The Certification of 100 mm Diameter Silicon Resistiviaty SRMs 2541 through 2547 using Dual-Configuration Four-Point Probe Measurements, NIST SP 260-131, August 1997, 84p.

2.
E.S. Lagergren, (with R.R Zarr, M.K Kumaran) NIST/NRC-Canada Interlaboratory Comparison of Guarded Hot Plate Measurements: 1993-1997. NIST IR 6087, 1997.

3.
M.G. Vangel (with W.J. Rossiter, E. Embree, K.M. Kraft, and J.F. Seiler), Performance of Tape-Bonded Seams of EPDM Membranes: The Effect of Loading on Creep Resistance Under Peel Stress, NIST Building Science Series 175, 1996.
4.
M.G. Vangel (with K.L. Stricklett), Electric Motor Efficiency Testing Under the New Part 431 of Chapter II of Title 10, Code of Federal Regulations: Enforcement Testing, NIST Technical Note 1422, 1996.
5.
Mark G. Vangel and James J. Filliben (with Walter J. Rossiter and Kevin M. Kraft), Performance Tape-Bonded Seams of EPDM Membranes: Effect of Material and Application Factors on Peel Creep-Rupture Response, NIST Building Science Series, 176, 1997.
6.
M.G. Vangel (with K.L. Stricklett), Analysis of Proposals for Compliance and Enforcement Testing Under the New Part 431; Title 10, Code of Federal Regulations, NISTIR 6092, 1997.

7.
C.M. Wang, (with K.B. Rochford), Uncertainty in null polarimeter measurements. NIST IR 96-5055, 1996, 16p.



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Date created: 7/20/2001
Last updated: 7/20/2001
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