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6.1.1 Publications in Print

1.
D.L. Banks (co-editor with S. Kotz and C.B. Read), Encyclopedia of Statistical Sciences, Update Volume 2, 1998.

2.
D.L. Banks and G. Constantine. Metric Models for Random Graphs, Journal of Classification, 15, 1998, 199-224.

3.
D.L. Banks, Maximum Entropy Models for Random Objects, Computing Science and Statistics, 30, 1998. In press.

4.
D.L. Banks, G. Constantine, A. Merriwether, Analysis of Pairwise Differences of DNA Sequences, Journal of Nonparametrics, 1998. In press.

5.
D.L. Banks, Testing Random Number Generators, Proceedings of the Statistical Computing Section of the American Statistical Association, 1998. In press.

6.
D.L. Banks and R.J. Olszewski, Estimating Local Dimensionality, Proceedings of the Statistical Computing Section of the American Statistical Association, 1997.

7.
D.L. Banks (with W. Shannon), A Distance Metric for Classification Trees, Proceedings of the 1997 Conference on Artificial Intelligence and Statistics, 1997.

8.
K.J. Coakley, D.S. Simons, Detection and Quantification of Isotopic Inhomogeneity, Chemometrics and Intelligent Laboratory Systems, 41(1998), 209-220.

9.
K.J. Coakley, Statistical Planning for a Neutron Lifetime Experiment Using Magnetically Trapped Neutrons, Nuclear Methods in Physics Research(A), 406(1998), 451-463

10.
L.M. Gill, (with L.K. Ives, S. Jahanmir, J.J. Filliben) High-Performance Ceramics: Effect of Grinding on Strength of Sintered Reaction Bonded Silicon Nitride, Interceram: International Ceramic Review,Volume 47, No. 3, 1998, pp. 168- 173.

11.
W.F. Guthrie (with S. Mayo and J.J. Kopanski), Intermittent-Contact Scanning Capacitance Microscopy Imaging and Modeling for Overlay Metrology Proc. of Int. Conf. on Characterization and Metrology for ULSI Technology, Gaithersburg, MD, March 23-27, 1998, pp 567-572.

12.
W.F. Guthrie (with M.W. Cresswell, N.M.P. Guillaume, R.A. Allen, R.N. Ghoshtagore, J.C. Owen III, Z. Osborne, N. Sullivan, and L.W. Linholm), Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films having Non-Planar Geometries, Proc. of IEEE International Conf. on Microelectronic Test Structures, Kanazawa, Japan, March 23-26, 1998.

13.
W.F. Guthrie (with M.W. Cresswell, R.A. Allen, L.W. Linholm, W.B. Penzes and A.W. Gurnell), Hybrid Optical-Electrical Overlay Test Structures, IEEE Transactions on Semiconductor Manufacturing, 10 (2), 1997.

14.
W.F. Guthrie (with N.J. Carino and G.M. Mullings), Evaluation of ASTM Standard Consolidation Requirements for Preparing High-Strength Concrete High Performance Concrete: Design and Materials and Recent Advances in Concrete Technology, ACI SP-172, Proc. of the Third ACI International Conf. on High-Performance Concrete, Kuala Lumpur, Malaysia, December 2-5, 1997, pp 733-768.

15.
W.F. Guthrie (with W.E. Lee, M.W. Cresswell, R.A. Allen, J.J. Sniegowski, and L.W. Linholm), Reference-Length Shortening by Kelvin Voltage Taps in Linewidth Test Structures Replicated in Monocrystalline Silicon Films, Proc. of IEEE International Conf. on Microelectronic Test Structures, Monterey, CA, March 17-28, 1997.

16.
W.F. Guthrie (with M.W. Cresswell, J.J. Sniegowski, R.N. Ghoshtagore, R.A. Allen and L.W. Linholm), Electrical Linewidth Test Structures Fabricated in Monocrystalline Films for Reference Material Applications, Proc. of IEEE International Conf. on Microelectronic Test Structures, Monterey, CA, March 17-28, 1997.

17.
C. Hagwood, R. Kacker, J. Yen, D. Banks, (with L. Rosenthal, L. Gallagher, P. Black) Reliability of Conformance Tests, Proceedings of the Twenty-Second Annual International Computer Software & Applications Conference-Vienna Austria, pp. 368-372.

18.
M.G. Vangel and M.S. Levenson (with M. Behlke, R. Saraswati, E. Mackey, R. Demiralp, B. Porter, V. Mandic, S. Azemard, M. Horvat, K. May, H. Emons, S. Wise), Certification of Three Mussel Tissue Standard Reference Materials (SRMs) for Methylmercury and Total Mercury Content, Fresenius' Journal of Analytic Chemistry, Vol 358, No 3, 1997, pp. 431-440.

19.
M.S. Levenson and M.G. Vangel (with R.E. Scholten, R. Gupta, J.J. McClelland, R.J. Celotta), Laser Collimation of a Chromium Beam, Physics Review A, Vol 55, No 2, 1997, pp. 1331-1338.

20.
M.S. Levenson and K.R. Eberhardt (with S.D. Phillips, B. Borchardt, D. Sawyer, W.T. Estler, D. Ward, M. McClain, B. Melvin, T. Hopp, Y. Shen), The Calculation of CMM Measurement Uncertainty Via the Method of Simulation by Constraints, Proceedings of the American Society for Precision Engineering, Vol 16, 1997, p. 443.

21.
K.R. Eberhardt and M.S. Levenson (with R.G. Gann), Fabrics for Testing the Ignition Propensity of Cigarettes, Fire and Materials, Vol 21, 1997, pp. 259-61.

22.
M.S. Levenson and K.R. Eberhardt (with W.T. Estler, S.D. Phillips, B. Borchardt, T. Hopp, M. McClain, Y. Shen, X. Zhang), Practical Aspects of Touch Trigger Probe Error Compensation, Precision Engineering, Vol 21, No 1, 1998, pp. 1-17.

23.
M.S. Levenson and K.R. Eberhardt (with S.D. Phillips, W.T. Estler), Calculation of Measurement Uncertainty Using Prior Information, Journal of Research of the National Institute of Standards and Technology, Vol 103, No 6, 1998, pp. 625-632.

24.
H.K. Liu, High-dimensional empirical linear prediction, Advanced Mathematical Tools in Metrology III, 79-90, 1997.

25.
M.G. Vangel and A.L. Rukhin, Maximum-Likelihood Analysis for Heteroscedastic One-Way Random Effects ANOVA in Interlaboratory Studies, Biometrics, 55, pp. 302-313, 1999.

26.
M.G. Vangel (with F.W. Scholz), Tolerance Bounds and Cpk Confidence Bounds Under Batch Effects, in Advances in Stochastic Models for Reliability, Quality and Saftey, ed. Kahle, et al., Birkhauser, pp. 361-380, 1998.

27.
M.G. Vangel (with W.J Rossiter, K.M. Kraft and E. Embree), EPDM Membrane Seam Performance, Roofing and Building Insulators Contractors Guide, pp. 65-68, February, 1998.

28.
A.L. Rukhin and M.G. Vangel, Estimation of a Common Mean and Weighted Means Statistics, Journal of the American Statistical Association, 93, pp. 303-309, 1998.

29.
M.G. Vangel, ANOVA Estimates of Variance Components for Quasi-Balanced Mixed Models, Journal of Statistical Planning and Inference, 70, pp. 139-148, 1998.

30.
M.G. Vangel, Tolerance Intervals, in Encyclopedia of Biostatistics, ed. P. Armitage and T. Colton, John Wiley and Sons, pp. 4542-4547, 1998.

31.
M.G. Vangel, Tolerance Regions, in Encyclopedia of Biostatistics, ed. P. Armitage and T. Colton, John Wiley and Sons, p. 4547, 1998.

32.
M.G. Vangel (with W.J. Rossiter, K.M. Kraft and E. Embree), Performance of Tape-Bonded Seams of EPDM Membranes: The Effect of Load on Peel-Creep, in Fourth International Symposium on Roofing Technology: Challenges for the 21st Century, National Roofing Contractors Association, 1997, pp. 1-13.

33.
C.M. Wang, D.F. Vecchia, (with M. Young, N.A. Brilliant), Robust regression applied to optical fiber dimensional quality control, Technometrics, 39 (1), 1997, pp. 25-33.

34.
C.M. Wang, H.K. Iyer, (with E.B. Brown), Tolerance intervals for assessing individual bioequivalence, Statistics in Medicine, 16, 1997, pp. 803-820.

35.
C.M. Wang, (with A.H. Rose, S.M. Etzel), Verdet constant dispersion in annealed optical fiber current sensors, Journal of Lightwave Technology, 15 (5), 1997, pp. 803-807.

36.
C.M. Wang, (with K.B. Rochford, A.H. Rose), NIST study investigates retardance uncertainty, Laser Focus World, May, 1997, pp. 223-227.

37.
C.M. Wang and J.D. Splett, Consensus values and reference values illustrated by the Charpy machine certification program, Journal of Testing and Evaluation, 25 (3), 1997, pp. 308-314.

38.
C.M. Wang, (with C.T. Lam), A mixed-effects model for the analysis of circular measurements, Technometrics, 39 (2), 1997, pp. 119-126.

39.
C.M. Wang, (with K.B. Rochford, A.H. Rose, P.A. Williams, I.G. Clarke, P.D. Hale, G.W. Day), Design and performance of a stable linear retarder, Applied Optics, 36, (25), 1997, pp. 6458-6465.

40.
C.M. Wang, (with P.A. Williams, A.H. Rose), Rotating-polarizer polarimeter for accurate retardance measurement, Applied Optics, 36, (25), 1997, pp. 6466-6472.

41.
C.M. Wang, (with K.B. Rochford), Accurate interferometric retardance measurements, Applied Optics, 36, (25), 1997, pp. 6473-6479.

42.
C.M. Wang, (with C.A. Hamilton), The fourth interlaboratory comparison of 10 V Josephson voltage standards in North America, Metrologia, 35, (1), 1998, pp. 33-40.

43.
C.M. Wang, (with J.R. Juroshek, G.P. McCabe), Statistical analysis of network analyzer measurements, CAL LAB, The International Journal of Metrology, May-June, 1998, pp. 26-33.

44.
C.M. Wang, (with P.A. Williams), Corrections to fixed analyzer measurements of polarization mode dispersion, Journal of Lightwave Technology, 16, (4), 1998, pp. 534-541.

45.
C.M. Wang, (with C.N. McCowan, D.P. Vigliotti), Charpy impact verification data (1994-1996): A summary, Journal of Testing and Evaluation, 27, (2), 1999, pp. 89-99.

46.
G.L. Yang, Markov Chains and Nerve Impulses: An Interface between Statistics and Neurophysiology, invited paper, in Advances in the Theory and Practice of Statistics: A Volume in Honor of Samuel Kotz, eds. Norman L. Johnson & N. Balakrishnan, John Wiley, 1997, pp. 107-122.

47.
G.L. Yang, Le Cam's procedure and sodium channel experiments, Festschrift for Lucien Le Cam: Research Papers in Probability and Statistics , D. Pollard, E. Torgersen & G.L.  Yang, eds. Springer-Verlag, 1997, pp. 411-422.

48.
G.L. Yang, with D. Pollard, E. Torgersen, editors : Festschrift for Lucien Le Cam: Research Papers in Probability and Statistics, Springer, 1997, 435pp.

49.
G.L. Yang, Kaplan-Meier Estimator, in Encyclopedia of Statistical Sciences, Update Vol. 1, S. Kotz, ed. John Wiley, 1997, pp. 334-344.
50.
G.L. Yang, Comparing censoring and random truncation via nonparametric estimation of a distribution function (invited paper, with discussant David. M. Caditz), in Statistical Challenges in Modern Astronomy, II, ed. E. D. Feigelson and G. J. Buba, Springer, 1997, pp. 83-103.
51.
G.L. Yang, Le Cam's procedure and sodium channel experiments, Festschrift for Lucien Le Cam: Research Papers in Probability and Statistics , D. Pollard, E. Torgersen & G. L. Yang, eds. Springer-Verlag, 1997, pp. 411-422.

52.
Grace L. Yang, (with J.L. Xu), An exponential characterization based on a Type II censored sample, Statistics and Probability Letters, 31, pp. 295-299.
53.
Grace L. Yang, (with S. He) The Strong Law under Random Truncation, Annals of Statistics, 26, 1998, pp. 992-1010.

54.
Grace L. Yang, (with S. He) Estimation of the truncation probability in the random truncation model, Annals of Statistics, 26, 1998, pp. 1011-1027.

55.
J.H. Yen, D.L. Banks, C. Hagwood, R.N. Kacker, (with P.E. Black, L.J. Gallagher, L.S. Rosenthal), Software Testing: Protocol Comparison, Conference Proceedings of The Eleventh International Software Quality Week, 1998, vol. 2.

56.
N.F. Zhang, Estimating Process Capability Indices for Autocorrelated Data, Journal of Applied Statistics, 25(4), 1998, pp. 559-574.

57.
N.F. Zhang, A Statistical Control Chart for Stationary Process Data, Technometrics, 40, 1998, pp. 24-38.

58.
N.F. Zhang, Combining Process Capability Indices, 1997 Proceedings of the Section on Quality and Productivity of American Statistical Association, pp. 84-89.

59.
N.F. Zhang, (with M.T. Postek, R.D. Larrabee), Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments, Metrologia, 34, 1997, pp. 467-477.

60.
N.F. Zhang, Detection Capability of Residual Control Chart for Stationary Processes, Journal of Applied Statistics , 24(4), 1997, pp. 475-492.

61.
N.F. Zhang, Autocorrelation Analysis of Some Linear Transfer Function Models and Its Applications in the Dynamic Process Systems, Lectures in Applied Mathematics, 33, 1997, pp. 385-399.
62.
N.F. Zhang, (with M.T. Postek, R.D. Larrabee, A.E. Vladar, W.J. Keery, S.N. Jones), A Statistical Measure for the Sharpness of SEM Images, Proceedings of SPIE, 1997, vol. 2050, pp. 375-386.



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Date created: 7/20/2001
Last updated: 7/20/2001
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