4.4 Statistical Engineering Seminar Series

M.S. Levenson (Coordinator)
Statistical Engineering Division, ITL

The Statistical Engineering Division maintains a seminar program, emphasizing NIST applications. Some seminars are of direct interest to NIST scientists and others educate SED staff to better serve NIST. For example, early in development of wavelets, SED invited Iain Johnstone from Stanford to speak on the topic. The seminar was widely attended and the basis for a collaboration on an imaging processing problem with William Pitts of the Fire Science Division. Seminars have the additional benefit of exchanging ideas to the wider statistical community. This helps interest other statistical researchers outside of NIST in NIST problems.

In additional to inviting outside people to NIST, SED benefits from seminars given by SED staff. These seminars allow knowledge to be spread within SED and NIST and allow staff to research new statistical material. Case study seminars of NIST applications are particularly valuable here, since it is likely that the methods used in the case study will have other applications at NIST.

Recent SED sponsored seminars:

$\bullet$ Use of the StRD Data Sets to Validate Statistical & Quasi-Statistical Software B. McCullough, Mass Media Bureau, Federal Communications Commission, Nov. 10, 1999.

$\bullet$ Uncertainty When the Number of Results is Small: A Type B Approach Mark Levenson, Statistical Engineering Division, ITL, July 13, 1999.

$\bullet$ A Regression Case Study: The Non-Linear Modeling of a 2-Dimensional Family of Curves Involving P-Type Semi-Conductor Electron Mobility Herb Bennett, Semiconductor Electronics Division, EEEL, James Filliben, Statistical Engineering Division, ITL, December 14, 1998.

$\bullet$ Bayesian Environmental Policy Decisions: Two Case Studies Lara J. Wolfson, University of Waterloo, November 12, 1998.

$\bullet$ Information-intensive Drug Discovery: Genomics, Proteomics, and Bioinformatics John N. Weinstein, M.D., Ph.D., Laboratory of Molecular Pharmacology, National Cancer Institute, October 21, 1998.

$\bullet$ Some Comments on Statistical Models in Software Reliability Jerry Lawless, The University of Waterloo, October 14, 1998.

$\bullet$ A Two-Component Model Measurement Error Model in Analytical Chemistry David Rocke, Center for Image Processing and Integrated Computing, The University of California, Davis, July 23, 1998.

$\bullet$ Thermodynamic Integration and Path Sampling Xiao-Li Meng, Department of Statistics, The University of Chicago, July 6, 1998.

$\bullet$ Does Code Decay? Alan F. Karr, National Institute of Statistical Sciences, May 11, 1998.

$\bullet$ Recent Work in Multivariate Analysis on Principal Components: A Review Thomas Matthew, Department of Mathematics and Statistics, University of Maryland, Baltimore County Campus, March 27, 1998.

       

Date created: 7/20/2001
Last updated: 7/20/2001
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