M.S. Levenson (Coordinator)

*Statistical Engineering Division, ITL*

The Statistical Engineering Division maintains a seminar program,
emphasizing NIST applications. Some seminars are of direct interest
to NIST scientists and others educate SED staff to better serve
NIST. For example, early in development of wavelets, SED invited Iain
Johnstone from Stanford to speak on the topic. The seminar was widely
attended and the basis for a collaboration on an imaging processing
problem with William Pitts of the Fire Science Division. Seminars
have the additional benefit of exchanging ideas to the wider
statistical community. This helps interest other statistical
researchers outside of NIST in NIST problems.

In additional to inviting outside people to NIST, SED benefits from
seminars given by SED staff. These seminars allow knowledge to be
spread within SED and NIST and allow staff to research new statistical
material. Case study seminars of NIST applications are particularly
valuable here, since it is likely that the methods used in the case
study will have other applications at NIST.

Recent SED sponsored seminars:

**Use of the StRD Data Sets to Validate Statistical &
Quasi-Statistical Software** B. McCullough, Mass Media Bureau,
Federal Communications Commission, Nov. 10, 1999.

**Uncertainty When the Number of Results is Small: A Type
B Approach** Mark Levenson, Statistical Engineering Division, ITL,
July 13, 1999.

**A Regression Case Study: The Non-Linear Modeling of a
2-Dimensional Family of Curves Involving P-Type Semi-Conductor
Electron Mobility** Herb Bennett, Semiconductor Electronics Division,
EEEL, James Filliben, Statistical Engineering Division, ITL, December
14, 1998.

**Bayesian Environmental Policy Decisions: Two Case
Studies** Lara J. Wolfson, University of Waterloo, November 12, 1998.

**Information-intensive Drug Discovery: Genomics,
Proteomics, and Bioinformatics** John N. Weinstein, M.D., Ph.D.,
Laboratory of Molecular Pharmacology, National Cancer Institute,
October 21, 1998.

**Some Comments on Statistical Models in Software
Reliability** Jerry Lawless, The University of Waterloo, October 14,
1998.

**A Two-Component Model Measurement Error Model in
Analytical Chemistry** David Rocke, Center for Image Processing and
Integrated Computing, The University of California, Davis, July 23,
1998.

**Thermodynamic Integration and Path Sampling** Xiao-Li
Meng, Department of Statistics, The University of Chicago, July 6,
1998.

**Does Code Decay?** Alan F. Karr, National Institute of
Statistical Sciences, May 11, 1998.

**Recent Work in Multivariate Analysis on Principal
Components: A Review** Thomas Matthew, Department of Mathematics and
Statistics, University of Maryland, Baltimore County Campus, March 27,
1998.