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 K.J.Coakley,
The Warmest Day of Any Week Tends to be the First or Last Day of that
Week,
NOAACIRES Climate Diagnostic Center,
Boulder, CO,
November 10, 1999
 2.
 K.J.Coakley,
Alignment of Noisy Signals,
Department of Statistics, Colorado State University,
October 25, 1999
 3.
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Course Builder using the NIST/SEMATECH Engineering Statistics Handbook,
demonstration at Ford Motor Co., Dearborn, MI, May 11, 1999.
 4.
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Procedures for Uncertainty Analysis, EURACHEM Workshop on
Efficient Methodology for the Evaluation of Uncertainty in Analytical Chemistry,
Helsinki, Finland, June 15, 1999.
 5.
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Uncertainty Analysis for Y2000, Laser Measurements Shortcourse, Boulder, CO,
August 13, 1999.
 6.
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Comparability, 16th IEEE Instrumentation and
Measurement Technology Conference, May 26, 1999,
Venice Italy.
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``Bayesian Methods in Physical Measurement," Joint Statistical
Meetings, Baltimore, MD, August 12, 1999.
 8.
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the Error Budget Grows?, Workshop on Statistical Analysis of
Interlaboratory Comparisons, National Physical Laboratory, Teddington,
England, November 11, 1999.
 9.
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Uncertainty, CCQM Workshop on Measurement Uncertainty, (CCQM is the
Consultative Committee for Amount of Substance
of the International Committee on Weights and Measures, CIPM),
Sevres, France, December 1, 1999.
 10.
 W.F. Guthrie, Analysis of Data from Key Comparison 3: Comparison of
the Realization of the ITS90 over the Range 83.8058 K to 933.473 K,
Working Group Meeting of the Comité Consultatif de Thermométrie,
Gaithersburg, MD, January 18, 2000.
 11.
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J. Prins, P. Spagon, P. Tobias, C. Zey, Engineering Statistics Internet
Handbook  Project Complete, Joint Statistical Meetings, Baltimore, MD,
August 11, 1999.
 12.
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Statistics Handbook Can be Used Improve Effectiveness in Manufacturing
Applications, SIMA Program Review, Gaithersburg, MD, July, 16, 1999.
 13.
 W.F. Guthrie, J.E. Rogers, J.J. Filliben, L.M. Gill, E. Lagergren,
M.G. Vangel, Statistical Reference Datasets (StRD) for Assessing the
Numerical Accuracy of Statistical Software, 31st Symposium on the
Interface: Models, Predictions, and Computing, Schaumburg, IL, June 10, 1999.
 14.
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May 18, 1999.
 15.
 W.F. Guthrie, InDepth View of Process Modeling Information in the
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Dearborn, MI, May 11, 1999.
 16.
 W.F. Guthrie, J.E. Rogers, J.J. Filliben, L.M. Gill, E. Lagergren,
M.G. Vangel, Statistical Reference Datasets (StRD) for Assessing
the Numerical Accuracy of Statistical Software, George Mason University,
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 17.
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 18.
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 19.
 R.N. Kacker, Why and When Should One Calibrate a Measurement System, a Keynote Address simulcast in Spanish, Mexican Association for Metrology, October 1, 1999, Queretaro, Mexico.
 20.
 S.D. Leigh, (with M. Levenson, M. Vangel, A. Rukhin)
Statistical Techniques for Validation of DiscreteEvent
Simulation Models for Networks,
DARPA/NIST Network Simulation and Validation Workshop,
Fairfax, VA, May 25, 1999.
 21.
 M.S. Levenson, Uncertainty When the Number of Results is Small:
A Type B Approach, NIST, Gaithersburg, MD, July 13, 1999.
 22.
 J.D. Splett, Robust Statistical Analysis of Vector Network
Analyzer Intercomparisons, National Conference of Standards
Laboratories Region 6 Boulder/Denver Section, NIST,
Boulder, CO, May 13, 1999.
 23.
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Sampling Oscilloscopes, Department of Statistics, Colorado State
University, October 18, 1999.
 24.
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International Software Assurance Conference, Chantilly, VA, March 1, 1999.
 25.
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August, 1998.
 26.
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Day, University of Maryland, Baltimore County, November 13, 1999.
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 N. F. Zhang, Statistical Control Charts for Monitoring the Mean of a Stationary Process, 50th Anniversary Conference of Department of Statistics, Viginia Polytechnic and State University, Blacksburg, VA, August, 1999.
Date created: 7/20/2001
Last updated: 7/20/2001
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