|
Interlaboratory ExperimentsBaechtel, S., Currie, L., Duewer, D., Leigh, S., Liu, H. K., Mudd, J. and Reeder, D. Interlaboratory comparison of autoradiographic DNA profiling measurements, Part II: Protocol effects," under submission. Baechtel, S., Currie, L., Duewer, D., Leigh, S., Liu, H. K., Mudd, J. and Reeder, D. (1994). "Interlaboratory comparison of autoradiographic DNA profiling measurements, Part I: Data and summary statistics," Analytical Chemistry, 3303-3317. Baghdadi, A., Bullis, W. M., Croarkin, M. C., Li, Yue-zhen, Scace, R. I., Series, R. W., Stallhofer, P. Watanabe, M. (1989). "Interlaboratory Determination of the Calibration Factor for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption." Journal of the Electrochemical Society, Vol. 136, No. 7, 2015-2024. Croarkin, Mary C.(1989). Chapter, "Statistical Analyses Relating the Infrared Measurements to the Absolute Measurements" in Database for and Statistical Analysis of the Interlaboratory Determination of the Conversion Coefficient for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption," NIST Spec. Pub. 400-82, editors: Baghdadi, A., Scace, R. I., Walters, E. J. Inn, K. G. W., Liggett, W. S., Volchok, H. L., Feiner, M. S., McInroy, J. F., Popplewell, D. S., Percival, D. R., Wessman, R. A., Bowen, V. T., Livingston, H. D., Kathren, R. L., Kawamura, H. (1990), "Interlaboratory Comparison of Actinides in Human Tissue 239Pu + 240Pu," Journal of Radioanalytical and Nuclear Chemistry, 138, 219- 229. Jerke, J.M., Croarkin, M. C. and Varner, R. N. (1982). "Semiconductor Measurement Technology: Interlaboratory Study on Linewidth Measurements for Antireflective Chromium Photomasks," NBS Spec. Publ. 400-74. Mudd, James; Bechtel, Samuel; Duewer, David; Currie, Lloyd; Reeder, Dennis; Leigh, Stefan and Liu, Hung-kung. "Interlaboratory Comparison of Autoradiographic DNA Profiling Measurements 1. Data and Summary Statistics," Analytical Chemistry, vol. 66, no. 20, 1994, pp. 3303-3317.
Date created: 6/5/2001 |