Lechner, J. A. and Martin, J. W. (1993). "Modeling and measuring ultraviolet radiation to predict damage to macromolecular materials." Proceedings of the American Chemical Society Symposium on Lifetime, Degradation and Stability of Macromolecular Materials.
Lechner, J. A.(statistics contributed by) (1992). "Standard for lognormal analysis of uncensored data, and of singly right-censored data utilizing the Persson and Rootzen method". JEDEC Standard JESD37, Electronic Industries Association, 25 p.
Lechner, J. A. (1989). "Estimators for censored (log) normal samples." Proceedings of the 1989 Reliability and Maintainability Symposium, 262-268.
Lechner, J. A. (1985). "Risk evaluation in high-altitude level flight." Proceedings of the 1984 Statistical Symposium on National Energy Issues, Seattle.
Lechner, J. A. (1965). "Simplified reliability calculations for complicated systems." Presented at first annual System Science Conference, October 1964; IEEE Transactions on Systems Science and Cybernetics, 31-36.
Nelson, Wayne, Schafft, H., Lechner, J. A. and Doganaksoy, N. "Electromigration, the lognormal distribution, and conductor length." Submitted to IEEE Transactions on Reliability.
Rossiter, W. J., Martin, J. W., Lechner, J. A. and Seiler, J. F. (1992). "Creep- rupture resistance of seam specimens sampled from in-service EPDM roof membranes." Presented at 8th International Waterproofing Congress, May 1992.
Schafft, H. A., Suehle, J. S. and Lechner, J. A. (1992). "Measurements for controlling electromigration in metallization interconnects: today and tomorrow." Proceedings Sixth International Conference on Interconnection Technology in Electronics, 16-20.
Schafft, Harry, Lechner, J. A. Sabi, Babak, Mahaney Mike and Smith, Ron C. (1988). "Statistics for electromigration testing." Proceedings of the 26th Annual Reliability Physics Symposium, April 1988.
Simiu, Emil and Lechner, J. A. (1987). "Experimental glass failure data and equivalent one-minute loads" Journal of Structural Engineering 113 2503-2508.
Zelen, M. and Dannemiller, Mary C. (1961). "The Robustness of Life Testing Procedures Derived from the Exponential Distribution." Technometrics, (1).
Zelen, M. and Dannemiller, Mary C. (1960). "Are Life Testing Procedures Robust?" Proceedings of the Sixth National Symposium on Reliability and Quality Control in Electronics, 185.
Date created: 6/5/2001