Statistical Engineering Division
Seminar Series
Identification of Measurement Issues in Protein Mass Spectrometry
Walter Liggett
Statistical Engineering Division, NIST
Admin. Building: Lecture Room A
Tuesday, January 11, 2005, 10:30-11:30 AM
Background:
Statistical analysis of replicate mass spectra can reveal sources of
measurement variation in protein mass spectrometry and thereby important
measurement issues.
Methods:
The measurement procedure is surface-enhanced laser desorption/ionization
(SELDI) time-of-flight (TOF) mass spectrometry. Sources of variation are
identified through statistical analysis of repeated measurements of a
human serum standard, specifically, 88 spectra determined for
mass-to-charge (m/z) values between 3300 and 30700. The statistical
approach involves functional canonical correlation analysis (CCA) applied
to disjoint intervals of the mass spectra for the purpose of finding
long-distance correlation structure. Before CCA is applied, the spectra
are normalized to remove spectrum-to-spectrum variation common to the
entire 3300-30700 domain. Examination of the relation between the CCA
scores and the spectra at each m/z shows the spectral peaks responsible
for high canonical correlation.
Results:
We show that after normalization, the heights of some pairs of spectral
peaks are correlated but others are not. Of the 17 spectral intervals
considered, we choose the seven pairs of intervals with highest
canonical correlation for interpretation. For some pairs, interpretation
entails the singly- and doubly-charged ionization of the same protein,
and for others, interpretation entails different proteins.
Conclusions:
It seems likely that sources of variation in the sample preparation step
are responsible for high correlations between proteins separated widely
in m/z. Non-uniformity in the crystallization on the protein chip surface
is a well-known source of long-distance correlation, but normalization
should remove its effect. Thus, the remaining high correlations suggest
other sources of variation in sample preparation.
NIST Contact:
Charles Hagwood,
(301) 975-2846.