Statistical Engineering Division Seminar

Dylan Williams
Electronmagnetics Division
NIST Boulder
Statistical Engineering Division Seminar
Thursday, December 7, 2006, 10:30-11:30 AM
Building 222, Room A240

Abstract

We will describe a covariance-based uncertainty analysis of NIST's new electro-optic sampling system. This analysis has allowed NIST to introduce a new paradigm in temporal waveform measurements, and is an excellent example of a fruitful collaboration between the EEEL and ITL. This is joint work with Arkadiusz Lewandowski, Tracy Clement, Paul Hale, Jack Wang, Andrew Dienstfrey and Nita Morgan.

Author Bio

Dylan F. Williams received a Ph.D. in Electrical Engineering from the University of California, Berkeley in 1986. He joined the Electromagnetic Fields Division of the National Institute of Standards and Technology in 1989 where he develops electrical waveform and microwave metrology. He has published over 80 technical papers and is a Fellow of the IEEE. He is the recipient of the Department of Commerce Bronze and Silver Medals, two Electrical Engineering Laboratory's Outstanding Paper Awards, two Automatic RF Techniques Group (ARFTG) Best Paper Awards, the ARFTG Automated Measurements Technology Award, and the IEEE Morris E. Leeds Award. Dylan is now Editor of the IEEE Transactions on Microwave Theory and Techniques.