SED navigation bar go to SED home page go to Dataplot home page go to NIST home page SED Home Page SED Contacts SED Projects SED Products and Publications Search SED Pages

Dataplot Vol 1 Auxiliary Chapter


CC

Name:
    CC (LET)
Type:
    Let Subcommand
Purpose:
    Compute the process capability index (CC) for a variable.
Description:
    The process capability index measure the performance (i.e., the capability) of an industrial process. The CC is a variant of the CP and CPK capability indices.

      CC = MAX((TARGET-XBAR)/(TARGET-LSL),(XBAR-TARGET)/USL)

    where USL and LSL are user specified upper and lower specification limits, TARGET is the target engineering limit, XBAR is the sample mean of the data. For this statistic, smaller is better.

    The specification limits define the range within which a product is considered acceptable (values outside this range indicate that a product is defective).

Syntax:
    LET <par> = CC <y>             <SUBSET/EXCEPT/FOR qualification>
    where <y> is the response variable;
                <par> is a parameter where the computed CC is stored;
    and where the <SUBSET/EXCEPT/FOR qualification> is optional.
Examples:
    LET A = CC Y1
    LET A = CC Y1 SUBSET TAG > 2
Note:
    The upper and lower specification limits and target value must be specified by the user as follows:

      LET LSL = <value>
      LET USL = <value>
      LET TARGET = <value>
Note:
    This statistic is also supported for the following plots:

      CC PLOT Y X
      DEX CC PLOT Y X1 ... Xk

    You need to specify the LSL, USL, and TARGET values (see above) before entering these commands. For more information on these plots, enter

      HELP STATISTIC PLOT
      HELP DEX PLOT
Default:
    None
Synonyms:
    None
Related Commands:
    CONTROL CHART = Generate a control chart.
    STATISTIC PLOT = Generate a statistic versus subset plot.
    DEX PLOT = Generate a dex plot.
    CP (LET) = Compute the process capability index.
    CPK (LET) = Compute the process capability index.
    CPNK (LET) = Compute the process capability index.
    CPM (LET) = Compute the process capability index.
    PERCENT DEFECTIVE (LET) = Compute the percentage of defectives in a sample.
    EXPECTED LOSS (LET) = Compute the expected loss of a sample.
Reference:
    "Guide to Quality Control", Kaoru Ishikawa, Asian Productivity Organization, 1982 (chapter 13).
Applications:
    Quality Control
Implementation Date:
    1998/12
Program:
    SKIP 25
    READ GEAR.DAT Y X
    LET USL = 0.995
    LET USL = 1.005
    LET TARGET = 1.0
    CHARACTER X BLANK
    LINE BLANK SOLID
    TITLE AUTOMATIC
    XTIC OFFSET 0.5 0.5
    TIC OFFSET UNITS DATA
    CC PLOT Y X

    plot generated by sample program

Date created: 6/5/2001
Last updated: 4/4/2003
Please email comments on this WWW page to alan.heckert@nist.gov.