SILICON WAFER THICKNESS DATA DATE--JULY 1990 NUMBER OF OBSERVATIONS = 20 NUMBER OF VARIABLES = 2 ORDER OF VARIABLES ON A LINE IMAGE-- 1. SPECIMEN THICKNESS (RESPONSE VARIABLE) 2. DAY STATISTICAL AREAS--MEAN CONTROL CHART RANGE CONTROL CHART S CONTROL CHART TO READ THIS FILE INTO DATAPLOT-- SKIP 25 READ CCXBAR.DAT Y X THICKNESS DAY -------------------- 24.5 1 22.4 1 23.7 1 23.5 1 23.8 1 23.6 2 23.8 2 22.5 2 22.5 2 23.0 2 25.0 3 22.6 3 23.7 3 22.7 3 22.9 3 24.3 4 22.6 4 23.2 4 23.3 4 23.2 4 23.8 5 24.9 5 23.6 5 22.5 5 24.8 5 24.4 6 22.8 6 22.6 6 22.9 6 23.1 6 23.7 7 22.9 7 23.3 7 23.2 7 23.9 7 23.4 8 23.7 8 23.5 8 23.4 8 23.3 8 24.9 9 23.9 9 23.1 9 24.5 9 23.7 9 23.0 10 23.8 10 22.5 10 23.6 10 23.4 10 24.8 11 24.0 11 24.1 11 23.9 11 23.9 11 24.4 12 23.7 12 23.2 12 23.0 12 23.8 12 24.9 13 24.0 13 22.2 13 23.2 13 22.3 13 24.3 14 23.6 14 22.4 14 23.2 14 23.2 14 23.4 15 23.7 15 24.0 15 22.5 15 24.0 15 25.3 16 24.9 16 23.1 16 22.6 16 23.7 16 24.1 17 23.6 17 23.8 17 24.0 17 23.3 17 25.9 18 25.4 18 22.4 18 24.3 18 24.3 18 26.4 19 24.4 19 22.1 19 26.4 19 23.2 19 27.8 20 22.7 20 25.0 20 25.9 20 25.4 20