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Dataplot Vol 2 Vol 1


CC

Name:
    CC (LET)
Type:
    Let Subcommand
Purpose:
    Compute the process capability index (CC) for a variable.
Description:
    The process capability index measure the performance (i.e., the capability) of an industrial process. The CC is a variant of the CP and CPK capability indices.

      \( \mbox{CC} = \max(\frac{\mbox{TARGET} - \bar{x}} {\mbox{TARGET} - \mbox{LSL}},\frac{\bar{x} - \mbox{TARGET}} {\mbox{USL}}) \)

    where USL and LSL are user specified upper and lower specification limits, TARGET is the target engineering limit, \( \bar{x} \) is the sample mean of the data. For this statistic, smaller is better.

    The specification limits define the range within which a product is considered acceptable (values outside this range indicate that a product is defective).

Syntax:
    LET <par> = CC <y>             <SUBSET/EXCEPT/FOR qualification>
    where <y> is the response variable;
                <par> is a parameter where the computed CC is stored;
    and where the <SUBSET/EXCEPT/FOR qualification> is optional.
Examples:
    LET A = CC Y1
    LET A = CC Y1 SUBSET TAG > 2
Note:
    The upper and lower specification limits and target value must be specified by the user as follows:

      LET LSL = <value>
      LET USL = <value>
      LET TARGET = <value>
Note:
    Dataplot statistics can be used in a number of commands. For details, enter

Default:
    None
Synonyms:
    None
Related Commands:
    CONTROL CHART = Generate a control chart.
    STATISTIC PLOT = Generate a statistic versus subset plot.
    DEX ... PLOT = Generate a dex <statistic> plot.
    CP = Compute the process capability index.
    CPK = Compute the process capability index.
    CNPK = Compute the process capability index.
    CPM = Compute the process capability index.
    PERCENT DEFECTIVE = Compute the percentage of defectives in a sample.
    EXPECTED LOSS = Compute the expected loss of a sample.
Reference:
    Kaoru Ishikawa (1982), "Guide to Quality Control," Asian Productivity Organization, (chapter 13).
Applications:
    Quality Control
Implementation Date:
    1998/12
Program:
    SKIP 25
    READ GEAR.DAT Y X
    LET USL = 0.995
    LET USL = 1.005
    LET TARGET = 1.0
    CHARACTER X BLANK
    LINE BLANK SOLID
    TITLE AUTOMATIC
    XTIC OFFSET 0.5 0.5
    TIC OFFSET UNITS DATA
    CC PLOT Y X

    plot generated by sample program

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Date created: 6/5/2001
Last updated: 11/02/2015

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