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Dataplot Vol 1 Auxiliary Chapter

CPM

Name:
    CPM (LET)
Type:
    Let Subcommand
Purpose:
    Compute the process capability index (CPM) for a variable.
Description:
    The process capability index measure the performance (i.e., the capability) of an industrial process. The CPM is a variant of the CP and CPK capability indices.

      CPM = (USL - LSL)/(6*SQRT(S**2 + (XBAR - TARGET)**2))

    where USL and LSL are user specified upper and lower specification limits, TARGET is the target engineering limit, XBAR and s are the sample mean and standard deviation of the data. For this statistic, larger is better.

    The specification limits define the range within which a product is considered acceptable (values outside this range indicate that a product is defective).

Syntax:
    LET <par> = CPM <y>             <SUBSET/EXCEPT/FOR qualification>
    where <y> is the response variable;
                <par> is a parameter where the computed CPM is stored;
    and where the <SUBSET/EXCEPT/FOR qualification> is optional.
Examples:
    LET A = CPM Y1
    LET A = CPM Y1 SUBSET TAG > 2
Note:
    The upper and lower specification limits and target value must be specified by the user as follows:

      LET LSL = <value>
      LET USL = <value>
      LET TARGET = <value>
Note:
    This statistic is also supported for the following plots:

      CPM PLOT Y X
      DEX CPM PLOT Y X1 ... Xk

    You need to specify the LSL, USL, and TARGET values (see above) before entering these commands. For more information on these plots, enter

      HELP STATISTIC PLOT
      HELP DEX PLOT
Default:
    None
Synonyms:
    None
Related Commands:
    CONTROL CHART = Generate a control chart.
    STATISTIC PLOT = Generate a statistic versus subset plot.
    DEX PLOT = Generate a dex plot.
    CP (LET) = Compute the process capability index.
    CPK (LET) = Compute the process capability index.
    CPNK (LET) = Compute the process capability index.
    CC (LET) = Compute the process capability index.
    PERCENT DEFECTIVE (LET) = Compute the percentage of defectives in a sample.
    EXPECTED LOSS (LET) = Compute the expected loss of a sample.
Reference:
    "Guide to Quality Control", Kaoru Ishikawa, Asian Productivity Organization, 1982 (chapter 13).
Applications:
    Quality Control
Implementation Date:
    1998/12
Program:
    SKIP 25
    READ GEAR.DAT Y X
    LET LSL = 0.995
    LET USL = 1.005
    LET TARGET = 1.0
    CHARACTER X BLANK
    LINE BLANK SOLID
    TITLE AUTOMATIC
    CPM PLOT Y X

    plot generated by sample program

Date created: 6/5/2001
Last updated: 4/4/2003
Please email comments on this WWW page to alan.heckert@nist.gov.