NIST/ITL StRD 
Dataset Name:   SiRstv     (SiRstvt.dat)


File Format:    ASCII
                Certified Values   (lines 41 to 47)
                Data               (lines 61 to 65) 


Procedure:      Analysis of Variance


Reference:      Ehrstein, James and Croarkin, M. Carroll.
                Unpublished NIST dataset.


Data:           1 Factor
                5 Treatments
                5  Replicates/Cell
                25 Observations
                3 Constant Leading Digits
                Lower Level of Difficulty
                Observed Data


Model:          6 Parameters (mu,tau_1, ... , tau_5)
                y_{ij} = mu + tau_i + epsilon_{ij}








Certified Values:

Source of                  Sums of               Mean               
Variation          df      Squares              Squares             F Statistic

Between Instrument  4 5.11462616000000E-02 1.27865654000000E-02 1.18046237440255E+00
Within Instrument  20 2.16636560000000E-01 1.08318280000000E-02

                   Certified R-Squared 1.90999039051129E-01

                   Certified Residual
                   Standard Deviation  1.04076068334656E-01








Data:
                     Instrument

    1          2          3          4          5

196.3052   196.3042   196.1303   196.2795   196.2119
196.1240   196.3825   196.2005   196.1748   196.1051
196.1890   196.1669   196.2889   196.1494   196.1850
196.2569   196.3257   196.0343   196.1485   196.0052
196.3403   196.0422   196.1811   195.9885   196.2090