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Contributed Session: Experiment Design Applications
Case Studies in Design & Analysis of Computer Experiments
Andrew J. Booker Computer simulations are used in the analysis of many products and processes at Boeing. This provides a large and varied arena for the application of design and analysis of computer experiments (DACE) as described in Sacks, Welch, Mitchell and Wynn (Statist. Sci. 4 (1989):409--435). This talk will describe the approach to DACE used at Boeing and, as time permits, present case studies in aerodynamic design, process optimization and electrical power system design. The talk will conclude with suggestions of areas of research which would benefit practitioners.
[Andrew J. Booker, Boeing Information & Support Services, P.O. Box 3707, Seattle, WA 98124-2207 USA; booker@espresso.rt.cs.boeing.com ] Applying "Incomplete" Selective t-Covering Experimental Designs to Software Testing
I. S. Dunietz
C. L. Mallows
A. Iannino
In performing functional testing on a Software Unit under Test (SUT),
we define I relevant factors or parameters, where each factor i takes
on q_i settings. The product, Q, of these factors' settings defines a
partition of the SUT's input domain. Resource constraints often
preclude running one or more test cases constructed from each of the
strata in the partition. We analyze (for a specific SUT) the code
coverage achieved by test designs that guarantee testing all
combinations of test factor settings taken t at a time (i.e.,
t-covering designs) where t
[W. K. Ehrlich,
AT&T, 480 Red Hill Rd., Middletown, NJ 07748, USA;
W.K.Ehrlich@att.com
]
Yield Optimization Using Response Surfaces
Timothy Tan
Yaacob Ibrahim
Loh Han Tong
Tolerances in circuit components such as resistors and capacitors
will invariably affect the circuit design. Variabilities in the responses can
lead to some non-conforming designs thereby affecting product quality and the
overall manufacturing yield. Tolerances can be treated in the design stage by
optimizing the yield. A strategy which combines a simulation-based yield
optimization method with response surface is proposed. Using Monte Carlo
simulation, the Centre-of-Gravity (CoG) method evaluates the yield and search
along the direction of increasing yield. The search however does not converge
but tends to oscillate about the optimal solution. A response surface for the
yield is then fitted over the oscillating region using points generated from
the CoG method. The response surface is then used to optimise the yield. A
dramatic yield improvement has been observed on several examples. Several
successive fits of the response surface also lead to significant yield
improvement.
[Dr Yaacob Ibrahim,
Dept. of Industrial & Systems Engineering,
National Univ. of Singapore,
10 Kent Ridge Crescent,
SINGAPORE 119260
iseyacob@leonis.nus.sg
]
Reliability Improvement of Disk Drives Through Multiresponse Experiments
Vijendra P. Singh
Manesh Shah
Jagdish S. Rustagi
In computer disk manufacturing the following chemical engineering problem
arises. The process involves preheating followed by deposition of various
layers of metals and overcoats in a series of chambers, through which each disk
travels sequentially. This continuous process is controlled by several
parameters such as voltage and current, gas flow and current pulse duration in
each chamber. The reliability is measured through magnetic parameters on
different tracks in sampled disks. The challenge for reliability improvement is
to first characterize this process by determining the most critical control
variables and their interactions. These variables result in various responses
such as the magnetism and disk layer uniformity. The challenge is not only in
multiresponse characterization but also in combining historic experimental data
with minimum number of additional experiments to obtain the process
relationship for optimal reliability determination of the disk. This problem
has been solved using the theory of design of sequential experiments. Several
other engineering applications in the disk drive industry will be discussed.
[Vijendra P. Singh,
Seagate Technology,
P.O.Box 66360,
380 El Pueblo,
Scotts Valley, CA 95067-0360 USA;
vic_singh@notes.seagate.com
]
Date created: 6/5/2001 |