2.
Measurement Process Characterization
2.4. Gauge R & R studies 2.4.4. Analysis of variability
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Example of repeatability calculations |
Short-term standard deviations based on
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Source of variability |
| Degrees of freedom (DF) | Std Devs |
Repeatability | \( {\large s}_1 = \sqrt{SS/\nu} \,\, \longrightarrow \) | ||
Wafer #138 Wafer #139 Wafer #140 Wafer #141 Wafer #142 SUM |
0.48115 0.69209 0.48483 1.21752 0.30076 3.17635 |
60 60 60 60 60 300 |
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