2.
Measurement Process Characterization
2.4. Gauge R & R studies 2.4.4. Analysis of variability


Example of repeatability calculations 
Shortterm standard deviations based on

Source of variability 
 Degrees of freedom (DF)  Std Devs 
Repeatability  \( {\large s}_1 = \sqrt{SS/\nu} \,\, \longrightarrow \)  
Wafer #138 Wafer #139 Wafer #140 Wafer #141 Wafer #142 SUM 
0.48115 0.69209 0.48483 1.21752 0.30076 3.17635 
60 60 60 60 60 300 
