SED navigation bar go to SED home page go to SED publications page go to NIST home page SED Home Page SED Contacts SED Projects SED Products and Publications Search SED Pages


contents     previous     next


6.1.4 Publications in Process

1.
K.J .Coakley, Nonequilibrium Kinetics of Neutral Atoms in a Harmonic Potential, submitted to Physical Review A

2.
M.Holland,J.Williams, K.J.Coakley and J.Cooper, Trajectory Simulation of Kinetic Equations for Classical Systems, submitted to Quantum Optics

3.
R.C.  Hagwood, K.J.Coakley, H.K. Liu and D. Simons,Comparing Two Poisson Processes in the Presence of Dead Time, submitted to Technometrics

4.
C. Croarkin (with T.V. Vorburger, J. F. Song, C.H.W. Giauque, T.B. Renegar, E.P. Whitenton, Stylus-Laser Surface Calibration System, Proceedings of 8th International Precision Engineering Seminar, submitted.

5.
K.R. Eberhardt, (with R.W. Mee), A Comparison of Uncertainty Criteria for Calibration, Technometrics, to appear.

6.
E.S. Lagergren, (with D.P. Bentz, E.J. Garboczi) Multi-Scale Microstructural Modelling of Concrete Diffusivity: Identification of Significant Variables, Cement, Concrete, and Aggregates, submitted.

7.
E.S. Lagergren, (with S.G. Malghan, R.S. Premachandran, R.K. Khanna) An Improved Method of Silicon Nitride Powder Processing, Powder Technology, submitted.

8.
C. Hagwood and M.S. Levenson, (with Y. Sivathanu) Computer Intensive Statistics Using Recursive Discrete Probability Functions, Journal of the American Statistical Society, submitted.

9.
H.K. Liu, (with J.T. Hwang) High-dimensional empirical linear prediction with application to quality assurance in industrial manufacturing.

10.
A. L. Rukhin, Change-Point Estimation: Linear Statistics and Asymptotic Bayes Risk, Mathematical Methods of Statistics, Vol 5, 1996.

11.
A. L. Rukhin, Change-Point Estimation as a Multiple Decision Problem, Statistics& Decisions, Vol 14, 1996.

12.
A. L. Rukhin, Testing Hypotheses in the Analysis of Variance for Some-Cells-Empty Data, Sankhya, Vol 58, 1996.

13.
A. L. Rukhin, (with A. Korostelev), Large Deviations Probabilities for Recursive M-Estimators, Stochastics and Stochastic Reports, 1996.

14.
A. L. Rukhin, (with M. Baron), Asymptotic Behavior of Confidence Regions in the Change-Point Problem, Journal of Statistical Planning and Inference, Vol 47, 1996.

15.
A. L. Rukhin, Linear Statistics in the Change-Point Estimation and Their Asymptotic Behavior, Canadian Journal of Statistics, 1997.

16.
A. L. Rukhin, (with I. Vajda), The Error Probability, Entropy and Equivocation When the Number of Input Messages Increases, IEEE Transactions, 1996.

17.
M.G. Vangel, ANOVA Estimates of Variance Components for Partially-Balanced Mixed Models, Journal of Statistical Planning and Inference, submitted.
18.
M.G. Vangel, One-Sided $\beta$-Content Tolerance Limits for Mixed Models With Two Components of Variance, Technometrics, submitted.

19.
D.F. Vecchia, H.K. Iyer (with C.T. Liao), Construction of orthogonal two-level designs of user-specified resolution where $N \neq 2^k$, Technometrics, to appear.

20.
D.F. Vecchia, H.K. Iyer (with P.W. Mielke), An application of Tchebysheff bounds for distribution free matched pairs tests, for Computational Statistics and Data Analysis.

21.
C.M. Wang, (with C.T. Lam), Confidence limits for proportion of conformance, Journal of Quality Technology, to appear.

22.
C.M. Wang, D.F. Vecchia, (with M. Young, N.A. Brilliant), Robust regression applied to optical fiber dimensional quality control, Technometrics, to appear.

23.
C.M. Wang, (with C.T. Lam), On estimation of geometric parameters for circular measurements, Technometrics, accepted.

24.
C.M. Wang, J.D. Splett, Consensus values and reference values illustrated by the Charpy machine certification program, Journal of Testing and Evaluation, submitted.

25.
C.M. Wang, (with J.R. Juroshek, G.P. McCabe), Statistical analysis of network analyzer measurements, IEEE Trans. Instrumentation and Measurement, submitted.

26.
C.M. Wang, (with P.D. Hale, R. Park, W.Y. Lau), Photoreceiver frequency response transfer standard: calibration using swept heterodyne method, IEEE J. Lightwave Technology, submitted.

27.
N.F. Zhang, Detection Capability of Residual Control Chart for Stationary Processes, Journal of Applied Statistics, to appear.

28.
N.F. Zhang, (with M.T. Postek, R.D. Larrabee, L. Carroll and W.J. Keery), A New Algorithm for the Measurement of Pitch in Metrology Instruments, Proceedings SPIE, 1996, to appear.

29.
N.F. Zhang, Estimating Process Capability Indices for Autocorrelated Processes, submitted for publication, 1995.

30.
N.F. Zhang, A Statistical Control Chart for Stationary Process Data, submitted for publication, 1995.



contents     previous     next

Date created: 7/20/2001
Last updated: 7/20/2001
Please email comments on this WWW page to sedwww@nist.gov.