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4.5 Statistical Methods for Mass Metrology

Carroll Croarkin

Statistical Engineering Division, ITL

Jerry Keller

Automated Technology Production Division, Manufacturing Engineering Laboratory

A workshop on statistical treatment of mass measurements was given at the Technological University of Panama, Panama City, Panama in May 1997. The workshop was sponsored by the Organization of American States and the Ministry for Technology of Panama to support the System for Inter-American Metrology where NIST is the lead laboratory for mass mesurements.

Participants from the national laboratories of Central America, who are already proficient in mass metrology, were trained in statistical procedures relating to: theory and solution of weighing designs, propagation of uncertainties through several series of weighing designs; statistical control of the measurement process using check standards; precision of the balances; and computation of final uncertainties.

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Date created: 7/20/2001
Last updated: 7/20/2001
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