SED navigation bar go to SED home page go to SED publications page go to NIST home page SED Home Page SED Contacts SED Projects SED Products and Publications Search SED Pages

contents     previous     next

6.1.2 NIST Technical Reports

C. Croarkin (with J. R. Ehrstein), Standard Reference Materials: The Certification of 100 mm Diameter Silicon Resistiviaty SRMs 2541 through 2547 using Dual-Configuration Four-Point Probe Measurements, NIST SP 260-131, August 1997, 84p.

M.G. Vangel (with W.J. Rossiter, E. Embree, K.M. Kraft, and J.F. Seiler), Performance of Tape-Bonded Seams of EPDM Membranes: Factors Affecting the Creep-Rupture Response of Tape-Bonded and Liquid-Adhesive Bonded Seams, NIST Building Science Series 177, 1998.

M.G. Vangel and J.J. Filliben (with W.J. Rossiter and K.M. Kraft), Performance Tape-Bonded Seams of EPDM Membranes: Effect of Material and Application Factors on Peel Creep-Rupture Response, NIST Building Science Series, 176, 1997.

M.G. Vangel (with K.L. Stricklett), Analysis of Proposals for Compliance and Enforcement Testing Under the New Part 431; Title 10, Code of Federal Regulations, NISTIR 6092, 1997.

C.M. Wang, (with S.L. Gilbert, W.C. Swann), Standard reference materials: hydrogen cyanide H13C14N absorption reference for 1530-1560 nm wavelength calibration - SRM 2519, NIST Special Publication 260-137, 1998.

contents     previous     next

Date created: 7/20/2001
Last updated: 7/20/2001
Please email comments on this WWW page to