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6.1.1 Publications in Print

1.
K.J.Coakley with (P.R.Huffman, C.R.Brome, J.S.Butterworth, M.S.Dewey, S.N.Dzhouyuk,
R.Golub, G.L.Greene, K.Habicht, S.K.Lamoreaux, C.E.Mattoni, D.N.McKinsey, F.E.Wietfeld, J.M.Doyle), Magnetic Trapping of Neutrons, Nature, 403(2000), 62-64.

2.
K.J.Coakley with( P.R.Huffman, C.R.Brome, J.S.Butterworth, M.S.Dewey, S.N.Dzhouyuk,
R.Golub, G.L.Greene, K.Habicht, S.K.Lamoreaux, C.E.Mattoni, D.N.McKinsey, F.E.Wietfeld, J.M.Doyle). Progress towards magnetic trapping of ultracold neutrons, Nuclear Methods in Physics Research(A), 440:3(2000), 522-527.

3.
K.J.Coakley with( C. R. Brome, J. S. Butterworth, S. N. Dzhosyuk, P. R. Huffman, C. E. H. Mattoni, D. N. McKinsey, J. M. Doyle, K. J. Coakley, M. S. Dewey, D. M. Gilliam, G. L. Jones, F. E. Wietfeldt, R. Golub, K. Habicht, M. D. Cooper, G. L. Greene and S. K. Lamoreaux), Progress Towards Magnetic Trapping of Ultracold Neutrons (Abstract), Bulletin  of  the  American  Physical  Society, 44(1999), 989.

4.
K.J. Coakley, D.S. Simons, Detection and Quantification of Isotopic Inhomogeneity, Chemometrics  and  Intelligent  Laboratory  Systems, 41(1998), 209-220.

5.
K.J. Coakley, Statistical Planning for a Neutron Lifetime Experiment Using Magnetically Trapped Neutrons, Nuclear  Methods  in  Physics  Research(A), 406(1998), 451-463.

6.
C.  Croarkin, Measurement Process Characterization, Chapter 2 in the NIST/SEMATECH Engineering Statistics Handbook, P.  Tobias and C.  Croarkin, editors.

7.
D. Banks, K.R. Eberhardt, Equating Laboratories: Modelling and Analysis, Conference Record of the 16th IEEE Instrumentation and Measurement Technology Conference (on CD-ROM), May, 1999, Venice Italy.

8.
W.F. Guthrie, (with M.W. Cresswell, N.M.P. Guillaume, W.E. Lee, R.A. Allen, R.N. Ghoshtagore, Z. Osborne, N. Sullivan and L.W. Linholm) Extraction of Sheet Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films with Non-Planar Geometries, IEEE Transactions on Semiconductor Manufacturing, Vol. 12, No. 2, 1999, pp 154-165.

9.
W.F. Guthrie, (with M.W. Cresswell, R.A. Allen, J.J. Sniegowski, R.N. Ghoshtagore, and L.W. Linholm) Extraction of Sheet Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films with Non-Planar Geometries, IEEE Transactions on Semiconductor Manufacturing, Vol. 11, No. 2, 1998, pp 182-193.

10.
W.F. Guthrie (with S. Mayo and J.J. Kopanski), Intermittent-Contact Scanning Capacitance Microscopy Imaging and Modeling for Overlay Metrology, Proceedings of the International Conference on Characterization and Metrology for ULSI Technology, Gaithersburg, MD, March 23-27, 1998, pp 567-572.

11.
W.F. Guthrie (with M.W. Cresswell, N.M.P. Guillaume, R.A. Allen, R.N. Ghoshtagore, J.C. Owen III, Z. Osborne, N. Sullivan, and L.W. Linholm), Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films having Non-Planar Geometries, Proceedings of the IEEE International Conference on Microelectronic Test Structures, Kanazawa, Japan, March 23-26, 1998, pp 29-38.

12.
C. Hagwood, (with Y. Sivathanu, G. Mulholland) The DMA Transfer Function with Brownian Motion, a Trajectory/Monte-Carlo Approach, Aerosol Science and Technology, 30, 1999, pp. 40-61.

13.
C. Hagwood, (with R. Clough, R. Fields) Estimation of the Stress-Threshold for the Weibull Inverse Power Law, IEEE Transactions on Reliability, 48 (2), 1999, pp. 176-181.

14.
R.N. Kacker, Why and When Should one Calibrate a Measurement System, Proceedings of the 1999 NCSL on CD-ROM, Charlotte, N.C.

15.
S.D. Leigh, (with J.F. Widmann, S.R. Charagundla, C. Presser) A Statistical Technique for Increasing the Size Range of a Phase Doppler Interferometer, Proc. Amer. Assoc. Aerosol Research, October, 1999.

16.
S.D. Leigh and G.L. Yang (with J.F. Widmann, S.R. Charagundla, C. Presser) Analysis of the Sampling Behavior of a Phase Doppler Interferometer, Proc. 37th AIAA Aerospace Sciences Meeting, Jan. 11-14, 1999, Reno, NV.

17.
S.D. Leigh, (with C. Beauchamp, H. Gates, D. Kelley) Overview of the Manufacture and Certification of Electrodeposited Coating Thickness Standard Reference Materials, Proc. 1999 NCSL Conf., July 11-15, 1999, Charlotte, NC.

18.
M.S. Levenson and K.R. Eberhardt (with W.T. Estler, S.D. Phillips, B. Borchardt, T. Hopp, M. McClain, Y. Shen, X. Zhang), Practical Aspects of Touch Trigger Probe Error Compensation, Precision Engineering, Vol 21, No 1, 1998, pp. 1-17.

19.
M.S. Levenson and K.R. Eberhardt (with S.D. Phillips, W.T. Estler), Calculation of Measurement Uncertainty Using Prior Information, Journal of Research of the National Institute of Standards and Technology, Vol 103, No 6, 1998, pp. 625-632.

20.
M.S. Levenson (with S.A. Margolis), Water Saturated 1-Octanol, a Calibrant at Microgram Water Levels for Karl Fischer Reagents and Instruments, Fresenius' Journal of Analytic Chemistry, to appear.

21.
W.S. Liggett (with R.A. Fletcher, J.R. Verkouteren, E.S. Windsor, D.S. Bright, E.B. Steel, and J.A. Small), SRM 2806 (ISO Medium Test Dust in hydraulic oil) a particle-contamination standard reference material for the fluid power industry, Fluid/Particle Separation Journal, 12, 1999, pp. 1-16.

22.
W.S. Liggett (with S.R. Low, R.J. Gettings, and J. Song), Rockwell hardness-A method dependent standard reference material, Proc. National Conference of Standards Laboratories Symposium, 1999.

23.
W.S. Liggett (with S.R. Low, D.J. Pitchure, and J. Song), Assessment of error sources in Rockwell hardness measurements, Proc. IMEKO-XV World Congress, 1999.

24.
W.S. Liggett (with J. Song, S.R. Low, D.J. Pitchure, and T. Vorburger), Measurement traceability of NIST standard Rockwell diamond indenters, Proc. IMEKO-XV World Congress, 1999.

25.
W.S. Liggett, Topic by Topic Performance of Information Retrieval Systems, The Seventh Text REtrieval Conference (TREC-7), eds. E.M. Voorhees and D.K. Harman, NIST Special Publication 500-242, 1999, pp. 105-114.

26.
W.S. Liggett (with A.R. Olsen, J. Sedransk, D. Edwards, C.A. Gotway, S. Rathbun, K.H. Reckhow, and L.J. Young), Statistical Issues for Monitoring Ecological and Natural Resources in the United States, Environmental Monitoring and Assessment, 54, 1999, pp. 1-45.

27.
W.S. Liggett (with W.M. Fisher), Insights From the Broadcast News Benchmark Tests, Proc. DARPA Broadcast News Transcription and Understanding Workshop February 8-11, 1998, Defense Advanced Research Project Agency, 1998, pp. 16-22.

28.
W.S. Liggett (with W.M. Fisher, A. Le, J.G. Fiscus, and D.S. Pallett), Data Selection for Broadcast News CSR Evaluations, Proc. DARPA Broadcast News Transcription and Understanding Workshop February 8-11, 1998, Defense Advanced Research Project Agency, 1998, pp. 12-15.

29.
J.D. Splett, (with R.M. Judish) Robust Statistical Analysis of Vector Network Analyzer Intercomparisons, Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference Volume 3, Venice, Italy, May 24-26, 1999, pp. 1320-1324.

30.
C.M. Wang, (with C.A. Hamilton) The Fourth Interlaboratory Comparison of 10 V Josephson Voltage Standards in North America, Metrologia, 35, (1), 1998, pp. 33-40.

31.
C.M. Wang, (with J.R. Juroshek, G.P. McCabe) Statistical Analysis of Network Analyzer Measurements, CAL LAB, The International Journal of Metrology, May-June, 1998, pp. 26-33.

32.
C.M. Wang, (with P.A. Williams) Corrections to Fxed Analyzer Measurements of Polarization Mode Dispersion, Journal of Lightwave Technology, 16, (4), 1998, pp. 534-541.

33.
C.M. Wang, (with C.N. McCowan, D.P. Vigliotti) Charpy Impact Verification Data (1994-1996): A Summary, Journal of Testing and Evaluation, 27, (2), 1999, pp. 89-99.

34.
C.M. Wang, A Day in the Life of a Statistician at the National Institute of Standards and Technology, STATS of the American Statistical Association, 24, Winter, 1999, pp. 19-20.

35.
C.M. Wang, K.J. Coakley, (with P.D. Hale) Least-squares estimation of time-base distortion of sampling oscilloscopes, IEEE Transactions on Instrumentation and Measurement, 48, (6), 1999, pp. 1324-1332.

36.
G.L. Yang, (with S. He), The Strong Law under Random Truncation, Annals of Statistics, V. 26, No.3. , 1998, 992-1010. (1998).
37.
G.L. Yang, (with S. He), Estimation of the truncation probability in the random truncation model, Annals of Statistics, V. 26, No.3, 1998, 1011-1027.

38.
G.L. Yang, A conversation with Lucien Le Cam, Statistical Science, May issue, 1999, 27p.

39.
J.H. Yen, D.L. Banks, C. Hagwood, R.N. Kacker, (with P.E. Black, L.J. Gallagher, L.S. Rosenthal), Software Testing: Protocol Comparison, Proceedings of The International Software Assurance Conference, Chantilly, VA. February 28-March 2, 1999.

40.
N.F. Zhang, (with M.T. Postek, R.D. Larrabee, A. E.  Vladar, W. J.  Keery, S. N.  Jones), Image Sharpness Measurement in Scanning Electron Microscope - Part III, Scanning, 21, 1999, pp. 246-252.

41.
N.F. Zhang, Statistical Control for Autocorrelated Data, Proceedings of EUROPT Series: Process and Equipment Control in Microelectronic Manufacturing, vol 3742, 1999,pp.  65-70.

42.
N.F. Zhang, (with D.  Banks, P.  Over), Blind Men and Elephants: Six Approaches to TREC Data, Information Retrieval, 1, 1999, pp. 7-34.

43.
N.F. Zhang, Estimating Process Capability Indices for Autocorrelated Data, Journal of Applied Statistics, 25(4), 1998, pp. 559-574.

44.
N.F. Zhang, A Statistical Control Chart for Stationary Process Data, Technometrics, 40, 1998, pp. 24-38.

45.
N.F. Zhang, Comparisons of Control Charts for Autocorrelated Data, Proceedings of the Section on Quality and Productvity of American Statistical Association, 1998, pp 8-12.



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Date created: 7/20/2001
Last updated: 7/20/2001
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