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6.2.1 Technical Talks

K.J.Coakley, The Warmest Day of Any Week Tends to be the First or Last Day of that Week, NOAA-CIRES Climate Diagnostic Center, Boulder, CO, November 10, 1999

K.J.Coakley, Alignment of Noisy Signals, Department of Statistics, Colorado State University, October 25, 1999

C.  Croarkin, Course Builder using the NIST/SEMATECH Engineering Statistics Handbook, demonstration at Ford Motor Co., Dearborn, MI, May 11, 1999.
C.  Croarkin, Plans for TC 69 Documents on Statistical Procedures for Uncertainty Analysis, EURACHEM Workshop on Efficient Methodology for the Evaluation of Uncertainty in Analytical Chemistry, Helsinki, Finland, June 15, 1999.
C.  Croarkin, Uncertainty Analysis for Y2000, Laser Measurements Short-course, Boulder, CO, August 13, 1999.

K.R. Eberhardt, Statistical Issues in Measuring Laboratory Comparability, 16th IEEE Instrumentation and Measurement Technology Conference, May 26, 1999, Venice Italy.
K.R. Eberhardt, Invited Discussant for session on ``Bayesian Methods in Physical Measurement," Joint Statistical Meetings, Baltimore, MD, August 12, 1999.
K.R. Eberhardt, Should Expanded Uncertainties ``Expand" Whenever the Error Budget Grows?, Workshop on Statistical Analysis of Interlaboratory Comparisons, National Physical Laboratory, Teddington, England, November 11, 1999.
K.R. Eberhardt, Examples and Recipes for the Calculation of Measurement Uncertainty, CCQM Workshop on Measurement Uncertainty, (CCQM is the Consultative Committee for Amount of Substance of the International Committee on Weights and Measures, CIPM), Sevres, France, December 1, 1999.

W.F. Guthrie, Analysis of Data from Key Comparison 3: Comparison of the Realization of the ITS-90 over the Range 83.8058 K to 933.473 K, Working Group Meeting of the Comité Consultatif de Thermométrie, Gaithersburg, MD, January 18, 2000.

W.F. Guthrie, J.J. Filliben, A. Heckert, B. Hembree, Emery Lin, J. Prins, P. Spagon, P. Tobias, C. Zey, Engineering Statistics Internet Handbook - Project Complete, Joint Statistical Meetings, Baltimore, MD, August 11, 1999.

W.F. Guthrie, Some Examples of How the NIST/SEMATECH Engineering Statistics Handbook Can be Used Improve Effectiveness in Manufacturing Applications, SIMA Program Review, Gaithersburg, MD, July, 16, 1999.

W.F. Guthrie, J.E. Rogers, J.J. Filliben, L.M. Gill, E. Lagergren, M.G. Vangel, Statistical Reference Datasets (StRD) for Assessing the Numerical Accuracy of Statistical Software, 31st Symposium on the Interface: Models, Predictions, and Computing, Schaumburg, IL, June 10, 1999.

W.F. Guthrie, Recent Progress on the NIST/SEMATECH Engineering Statistics Internet Handbook, SIMA Technical Seminar, Gaithersburg, MD, May 18, 1999.

W.F. Guthrie, In-Depth View of Process Modeling Information in the NIST/SEMATECH Engineering Statistics Internet Handbook, Ford Motor Company, Dearborn, MI, May 11, 1999.

W.F. Guthrie, J.E. Rogers, J.J. Filliben, L.M. Gill, E. Lagergren, M.G. Vangel, Statistical Reference Datasets (StRD) for Assessing the Numerical Accuracy of Statistical Software, George Mason University, Fairfax, VA, May 7, 1999.

C. Hagwood, Statistics in the Information Technology Age, Senior Banquet, A & T State University, Greensboro, NC, April 29, 1999.

C. Hagwood, Reliability of Conformance Tests, INFORMS National Meeting, Cincinnati, OH, May 5, 1999.

R.N. Kacker, Why and When Should One Calibrate a Measurement System, a Keynote Address simulcast in Spanish, Mexican Association for Metrology, October 1, 1999, Queretaro, Mexico.

S.D. Leigh, (with M. Levenson, M. Vangel, A. Rukhin) Statistical Techniques for Validation of Discrete-Event Simulation Models for Networks, DARPA/NIST Network Simulation and Validation Workshop, Fairfax, VA, May 25, 1999.

M.S. Levenson, Uncertainty When the Number of Results is Small: A Type B Approach, NIST, Gaithersburg, MD, July 13, 1999.

J.D. Splett, Robust Statistical Analysis of Vector Network Analyzer Intercomparisons, National Conference of Standards Laboratories Region 6 Boulder/Denver Section, NIST, Boulder, CO, May 13, 1999.

C.M. Wang, Least-squares Estimation of Time-base Distortion of Sampling Oscilloscopes, Department of Statistics, Colorado State University, October 18, 1999.

J.H. Yen, Software Testing: Protocol Comparison, International Software Assurance Conference, Chantilly, VA, March 1, 1999.

J.H. Yen, Trimmed Weighted Means, Joint Statistical Meetings, August, 1998.

J.H. Yen, Robust Estimation of Effect Sizes, Mid-Atlantic Probability and Statistics Day, University of Maryland, Baltimore County, November 13, 1999.

N. F.  Zhang, Statistical Process Control for Autocorrelated Data, EOS/SPIE Symposium on Microelectronic Manufacturing Technologies, Edinburgh, Scotland, May, 1999.

N. F.  Zhang, Statistical Control Charts for Monitoring the Mean of a Stationary Process, 50th Anniversary Conference of Department of Statistics, Viginia Polytechnic and State University, Blacksburg, VA, August, 1999.

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Date created: 7/20/2001
Last updated: 7/20/2001
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