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6.4.2 Refereeing

1.
K.J.Coakley, International Journal of Imaging Science and Technology.

2.
K.R. Eberhardt, Technometrics.

3.
C. Hagwood, Technometrics.

4.
C. Hagwood, Statistical Papers.

5.
C. Hagwood, Journal of Applied Meteorology.

6.
S.D. Leigh, Journal of Applied Meteorology.

7.
S.D. Leigh, World Press Publishing, extreme value theory manuscript proposal.

8.
M.S. Levenson, Metrologia.

9.
M.S. Levenson, Technometrics.

10.
M.S. Levenson, International Journal of Imaging Science and Technology.

11.
C.M. Wang, Communications in Statistics.
12.
C.M. Wang, Technometrics.

13.
J.H. Yen, Metrologia.
14.
J.H. Yen, Statistics and Probability Letters.

15.
N. F.  Zhang, Journal of the American Statistical Association.

16.
N.F. Zhang, Technometrics.


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Date created: 7/20/2001
Last updated: 7/20/2001
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