SED navigation bar go to SED home page go to Dataplot home page go to NIST home page SED Home Page SED Staff SED Projects SED Products and Publications Search SED Pages
Dataplot Vol 1 Vol 2

OUTPUT LINE NUMBER (SET)

Name:
    SET OUTPUT LINE NUMBERS
Type:
    Support Command
Purpose:
    Specify whether alphanumeric output will have line numbers at the beginning of each line.
Description:
    By default, Dataplot does not insert a line number to the beginning of output lines. However, there may be occassions where this is convenient (e.g., for debugging purposes).
Syntax:
    SET OUTPUT LINE NUMBERS <ON/OFF>
    where ON specifies that line numbers will be added to the output and OFF specifies that line numbers will not be added.
Examples:
    SET OUTPUT LINE NUMBERS ON
    SET OUTPUT LINE NUMBERS OFF
Default:
    OFF
Synonyms:
    None
Related Commands:
    CAPTURE = Re-direct output to a file.
Applications:
    Debugging
Implementation Date:
    2019/12
Program:
     
    SKIP 25
    READ BERGER1.DAT Y X BATCH
    .
    FEEDBACK OFF
    SET OUTPUT LINE NUMBERS ON
    CAPTURE FIT.OUT
    FIT Y X
    QUADRATIC FIT Y X
    END OF CAPTURE
    .
    LIST FIT.OUT
        
    The following output is generated
    1:  
    2:             Least Squares Multilinear Fit
    3:  
    4: Sample Size:                                        107
    5: Number of Variables:                                  1
    6: Residual Standard Deviation:               6.080924
    7: Residual Degrees of Freedom:                        105
    8: BIC:                                       393.6302
    9:  
    10: Replication Case:
    11: Replication Standard Deviation:            6.112687
    12: Replication Degrees of Freedom:                      29
    13: Number of Distinct Subsets:                          78
    14: Lack of Fit F Ratio:                      0.9856792
    15: Lack of Fit F CDF (%):                     46.30560
    16: Lack of Fit Degrees of Freedom 1:                    76
    17: Lack of Fit Degrees of Freedom 2:                    29
    18:  
    19: --------------------------------------------------------------------
    20:                                                Approximate
    21:            Parameter Estimates          Standard Deviation   t-Value
    22: --------------------------------------------------------------------
    23:   1  A0                   4.993680       1.125658        4.4362
    24:   2  A1        X         0.7311111      0.2455195E-01   29.7781
    25:  
    26:  
    27:             Least Squares Polynomial Fit
    28:  
    29: Sample Size:                                        107
    30: Degree:                                               2
    31: Residual Standard Deviation:               5.763679
    32: Residual Degrees of Freedom:                        104
    33: BIC:                                       385.8129
    34:  
    35: Replication Case:
    36: Replication Standard Deviation:            6.112687
    37: Replication Degrees of Freedom:                      29
    38: Number of Distinct Subsets:                          78
    39: Lack of Fit F Ratio:                      0.8461750
    40: Lack of Fit F CDF (%):                     27.77907
    41: Lack of Fit Degrees of Freedom 1:                    75
    42: Lack of Fit Degrees of Freedom 2:                    29
    43:  
    44: --------------------------------------------------------------------
    45:                                                Approximate
    46:            Parameter Estimates          Standard Deviation   t-Value
    47: --------------------------------------------------------------------
    48:   1  A0                 -0.6835040       1.908218       -0.3582
    49:   2  A1                   1.092788      0.1034408       10.5644
    50:   3  A2                 -0.4026586E-02  0.1122097E-02   -3.5884
    51:  
        

Privacy Policy/Security Notice
Disclaimer | FOIA

NIST is an agency of the U.S. Commerce Department.

Date created: 01/08/2020
Last updated: 01/08/2020

Please email comments on this WWW page to alan.heckert@nist.gov.